SEMICONDUCTOR DEVICE PACKAGE
A package includes a semiconductor die attached to a substrate and a molded body encapsulating the semiconductor die. The molded body is a six-sided rectangular box-like structure and at least a corner portion of the molded body formed by two adjacent sides is devoid of molding material reducing a size and a weight of the molded body.
1 . A package comprising:
a semiconductor die attached to a substrate; and
a molded body encapsulating the semiconductor die, wherein the molded body is a six-sided rectangular box-like structure and at least a corner portion of the molded body formed by two adjacent sides is devoid of molding material reducing a size and a weight of the molded body.
2 . The package of claim 1 , wherein a top surface of the molded body includes a heat dissipating surface, and wherein the semiconductor die encapsulated in the molded body is thermally coupled to the heat dissipating surface.
3 . The package of claim 1 , further comprising:
at least a lead attached to the semiconductor die, a portion of the lead extending to an outside of the molded body and forming an external terminal of the package, wherein the lead is a drain contact lead and a portion of the drain contact lead extending to the outside of the molded body is notched to reduce a strength of the drain contact lead.
4 . The package of claim 1 , further comprising:
at least a lead attached to a device contact pad on the semiconductor die, a portion of the lead extending to an outside the molded body and forming an external terminal of the package, wherein the lead is a drain contact lead shaped as a metal plate which extends to form a U-shape connector with side wings having end tips, wherein only the side wings having the end tips of the drain contact lead extend to the outside of the molded body.
5 . The package of claim 1 , further comprising:
a plurality of signal leads connected to a multiplicity of device contact pads on the semiconductor die, the multiplicity of device contact pads including a gate contact pad, a sense contact pad and at least a source contact pad, the plurality of signal leads extending to an outside of the molded body from a side of the molded body; and
a slot disposed in a top surface of the molded body along the side of the molded body, the slot having a width and a depth to increase a creepage distance to the plurality of signal leads extending to the outside of the molded body from the side of the molded body.
6 . The package of claim 1 , further comprising:
a pair of cutouts in the molded body extending from a bottom side toward a top side of the molded body, the cutouts forming clamping surfaces along sides of the molded body to clamp the package on a printed circuit board, the pair of cutouts being formed along an axis that is equidistant from a first side and an opposing second side of the molded body.
7 . The package of claim 1 , wherein the semiconductor die is attached to a die attach pad (DAP) on the substrate with a solder.
8 . The package of claim 1 , wherein the semiconductor die is attached to a die attach pad (DAP) on the substrate with a silver-based sinter.
9 . The package of claim 1 , further comprising:
a plurality of signal leads connected to a multiplicity of device contact pads on the semiconductor die, the multiplicity of device contact pads including a gate contact pad and a sense contact pad, the plurality of signal leads extending to an outside of the molded body from a side of the molded body, wherein the gate contact pad and the sense contact pad are wire bonded to a respective pair of signal leads.
10 . The package of claim 1 , further comprising:
a plurality of signal leads connected to a multiplicity of device contact pads on the semiconductor die, the multiplicity of device contact pads including at least a source contact pad, the plurality of signal leads extending to an outside of the molded body from a side of the molded body, wherein the source contact pad is aluminum wire bonded to a respective group of signal leads.
11 . The package of claim 1 , further comprising:
a plurality of signal leads connected to a multiplicity of device contact pads on the semiconductor die, the multiplicity of device contact pads including at least a source contact pad, the plurality of signal leads extending to an outside of the molded body from a side of the molded body, wherein the source contact pad is attached to a respective group of signal leads by a direct lead attach (DLA) clip.
12 . The package of claim 1 , wherein the semiconductor die is a silicon carbide (SiC) power transistor.
13 . The package of claim 1 , wherein the semiconductor die is a first semiconductor die, and wherein the package comprises a second semiconductor die encapsulated in the molded body, and wherein the first semiconductor die is an insulated-gate bipolar transistor (IGBT), and the second semiconductor die is a fast recovery diode (FRD) or a silicon carbide diode.
14 . A package comprising:
a semiconductor die attached to a substrate;
a molded body encapsulating the semiconductor die, wherein the molded body is a six-sided rectangular box-like structure; and
at least a lead attached the semiconductor die, a portion of the lead extending to an outside of the molded body and forming an external terminal of the package, wherein the lead is a drain contact lead and a portion of the drain contact lead extending to the outside of the molded body is notched to reduce a strength of the drain contact lead.
15 . The package of claim 14 , wherein a top surface of the molded body includes a heat dissipating surface, and wherein the semiconductor die encapsulated in the molded body is thermally coupled to the heat dissipating surface.
16 . The package of claim 14 , wherein the molded body is a six-sided rectangular box-like structure and at least a corner portion of the molded body formed by two adjacent sides is devoid of molding material reducing a size and a weight of the molded body.
17 . A method for fabricating a package, the method comprising:
disposing a semiconductor die on a substrate; and
encapsulating the semiconductor die in a molded body, wherein the molded body is a six-sided rectangular box-like structure and at least a corner portion of the molded body formed by two adjacent sides is devoid of molding material reducing a size and a weight of the molded body.
18 . The method of claim 17 , further comprising: disposing a heat dissipating surface in a top surface of the molded body; and thermally coupling the semiconductor die encapsulated in the molded body to the heat dissipating surface.
19 . The method of claim 17 , further comprising:
attaching a drain contact lead to the semiconductor die, a portion of the drain contact lead extending to an outside of the molded body and forming an external terminal of the package; and
notching the portion of the drain contact lead extending to an outside of the molded body to reduce a strength of the drain contact lead.
20 . A method for fabricating a package, the method comprising:
disposing a semiconductor die on a substrate;
encapsulating the semiconductor die in a molded body, wherein the molded body is a six-sided rectangular box-like structure;
attaching a drain contact lead to the semiconductor die, a portion of the drain contact lead extending to an outside of the molded body and forming an external terminal of the package; and
notching the portion of the drain contact lead extending to an outside of the molded body to reduce a strength of the drain contact lead.
21 . The method of claim 20 , further comprising: disposing a heat dissipating surface in a top surface of the molded body; and thermally coupling the semiconductor die encapsulated in the molded body to the heat dissipating surface.
22 . The method of claim 20 , wherein encapsulating the semiconductor die in the molded body includes excluding mold material from at least a corner portion of the molded body formed by two adjacent sides to reduce a size and a weight of the molded body.