IP Library Patent Application 18366887
Patent Application
App. No. 18/366,887

Efficient FET Body and Substrate Contacts

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Quick Facts
Patent No.
US None
App. No.
18/366,887
Abstract

Integrated circuit structures that significantly reduce the resistance associated with the body contact region and substrate region contact of a field-effect transistor (FET) compared to conventional designs. Embodiments include a FET having a body contact region, and optionally a substrate region contact, that includes germanium (Ge) alone or as an alloy with silicon (SiGe) and/or as a layered combination with silicon (e.g., a layer of Ge on a layer of Si). A first method includes fabricating a body contact region of a field-effect transistor by fabricating the field-effect transistor with an Si body contact region, and diffusing or implanting Ge within the Si. A second method includes fabricating a body contact region of a field-effect transistor by fabricating the field-effect transistor with an Si body contact region, etching away at least part of the Si body contact region to form a well, and depositing Ge within the well.

Claims (21)

1 . A field-effect transistor including a body contact region that includes germanium.

2 . The field-effect transistor of claim 1 , wherein the body contact region includes a mixture of germanium and silicon.

3 . The field-effect transistor of claim 1 , wherein the body contact region includes a mixture of germanium and silicon having a gradient of mostly silicon in a first region, a mixture of silicon and germanium in a second region adjacent to the first region, and mostly germanium in a third region adjacent to the second region.

4 . The field-effect transistor of claim 1 , wherein the body contact region is created by implantation or diffusion of germanium into silicon.

5 . The field-effect transistor of claim 1 , wherein the body contact region is created by deposition of germanium into an etched well.

6 . The field-effect transistor of claim 1 , wherein the body contact region includes a mixture of between about 1% germanium and about 100% germanium.

7 . The field-effect transistor of claim 1 , wherein the body contact region includes an overall concentration of germanium between about 15% and about 45% of the total material in the body contact region.

8 . The field-effect transistor of claim 1 , wherein the body contact region is in electrical contact with a body region of the field-effect transistor.

9 . The field-effect transistor of claim 1 , wherein the body contact region is in electrical contact with a body region and a substrate of the field-effect transistor.

10 . The field-effect transistor of claim 1 , wherein the body contact region is doped with P+ material.

11 . The field-effect transistor of claim 1 , wherein the body contact region is capped with a salicide layer.

12 . A field-effect transistor including a body contact region that includes germanium or a silicon-germanium alloy.

13 . The field-effect transistor of claim 12 , wherein the body contact region includes an alloy of germanium and silicon having a gradient of mostly silicon in a first region, a mixture of silicon and germanium in a second region adjacent to the first region, and mostly germanium in a third region adjacent to the second region.

14 . The field-effect transistor of claim 12 , wherein the body contact region is created by implantation or diffusion of germanium into silicon.

15 . The field-effect transistor of claim 12 , wherein the body contact region is created by deposition of germanium into an etched well.

16 . The field-effect transistor of claim 12 , wherein the body contact region includes a mixture of between about 1% germanium and about 100% germanium.

17 . The field-effect transistor of claim 12 , wherein the body contact region includes an overall concentration of germanium between about 15% and about 45% of the total material in the body contact region.

18 . The field-effect transistor of claim 12 , wherein the body contact region is in electrical contact with a body region of the field-effect transistor.

19 . The field-effect transistor of claim 12 , wherein the body contact region is in electrical contact with a body region and a substrate of the field-effect transistor.

20 . The field-effect transistor of claim 12 , wherein the body contact region is doped with P+ material.

21 .- 72 . (canceled)

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 17, 2024
From: PSEMI CORPORATION
To: MURATA MANUFACTURING CO., LTD.
Reel/Frame 067743/0607 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 12, 2024
From: SINGH, JAGAR; WILLARD, SIMON EDWARD
To: PSEMI CORPORATION
Reel/Frame 067087/0199 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 14, 2024
From: PSEMI CORPORATION
To: MURATA MANUFACTURING CO., LTD.
Reel/Frame 066597/0427 →