Multiple tile two-layered motherboard tester
A tester board system that includes a frame upon which a plurality of motherboard assemblies can be inserted for the purposes of BI and other types of component testing. Each motherboard assembly has memory channels disposed on an upper motherboard that can accommodate a plurality of memory components for testing, and the memory channels are connected to a CPU. The CPU is disposed on a lower motherboard and the memory channels are connected to the CPU via communication connectors that are passed via a connection column between the upper and lower motherboards.
1 . A motherboard assembly for component testing, comprising:
an upper motherboard;
at least one memory channel disposed on the upper motherboard;
a lower motherboard vertically separated from the upper motherboard by a gap;
at least one CPU disposed on the lower motherboard;
at least one support connector connecting the upper motherboard and the lower motherboard; and
at least one electronic connector communicatively coupling the at least one CPU with the at least one memory channel;
wherein the upper motherboard and lower motherboard are aligned parallel to each other along the length of the upper motherboard and lower motherboard such that a bottom side of the upper motherboard is disposed opposite an upper side of the lower motherboard; and
wherein no memory channels are disposed on the lower motherboard.
2 . The motherboard assembly of claim 1 , further comprising a connection column coupled to the upper motherboard and the lower motherboard.
3 . The motherboard assembly of claim 2 , wherein the at least one electronic connector is routed through the connection column.
4 . The motherboard assembly of claim 2 , comprising two to four connection columns.
5 . The motherboard assembly of claim 1 , further comprising an insulation layer disposed within the gap.
6 . The motherboard assembly of claim 5 , wherein the insulation layer occupies at least 70% of the volume of the gap.
7 . The motherboard assembly of claim 5 , wherein the insulation layer comprises at least one of air, vacuum, Styrofoam, rubber, or a material containing air or vacuum bubbles.
8 . The motherboard assembly of claim 1 , wherein the upper motherboard and lower motherboard are separated by a distance of between 1 mm and 100 mm.
9 . The motherboard assembly of claim 1 , wherein an area of the upper motherboard and an area of the lower motherboard differs by no more than 10%.
10 . The motherboard assembly of claim 1 , wherein the motherboard assembly is dimensioned to fit within a space on a frame, the frame dimensioned to fit at least two motherboard assemblies.
11 . A tester board system, comprising:
a frame dimensioned to receive at least two motherboard assemblies; and
each of the at least two motherboard assembly comprising:
an upper motherboard;
at least one memory channel disposed on the upper motherboard;
a lower motherboard vertically separated from the upper motherboard by a gap;
at least one CPU disposed on the lower motherboard;
at least one support connector connecting the upper motherboard and the lower motherboard; and
at least one electronic connector communicatively coupling the at least one CPU with the at least one memory channel;
wherein the upper motherboard and lower motherboard are aligned parallel to each other along the length of the upper motherboard and lower motherboard such that a bottom side of the upper motherboard is disposed opposite an upper side of the lower motherboard; and
wherein no memory channels are disposed on the lower motherboard.