Köhler illumination system for inspection of radiused end connectors
Systems, methods, and devices for providing Köhler illumination for inspection, under a microscope, of end connectors of fiber optic cables. In one aspect, a microscopy system provides Köhler illumination where a numerical aperture of the illumination (NA IL ) is greater than a numerical aperture of imaging (NA IM ). In another aspect, a reflected light microscopy system includes an array of light sources which illuminate a diffuser, which, in turn, projects the diffused light to reflect off of a beamsplitter and through an objective/condenser upon the end connector. In yet another aspect, the array of light sources may provide different light patterns to illuminate the end connector, and each light pattern may correspond to a different type of radiused end connector.
1 . A microscopy system, comprising:
a light source to provide illumination;
a diffuser to receive and diffuse the illumination from the light source, and to project the diffused illumination;
a beamsplitter to receive and reflect the diffused illumination;
an objective to receive and project the reflected diffused illumination upon a device under test (DUT); and
an imager to image the DUT by receiving reflected light from the DUT via the objective;
wherein either the diffuser or an image of the diffuser is disposed at the back focal plane of the objective to provide Köhler illumination to the DUT where a numerical aperture of illumination (NA IL ) is greater than a numerical aperture of imaging (NA IM ).
2 . The microscopy system of claim 1 , wherein the light source comprises:
an array of light sources disposed in a circular pattern to illuminate the diffuser.
3 . The microscopy system of claim 2 , wherein the array of light sources comprises:
an array of light emitting diodes (LEDs).
4 . The microscopy system of claim 2 , further comprising:
a controller to control the array of light sources to provide different lighting patterns to illuminate the diffuser,
wherein the different lighting patterns correspond to different NAILS.
5 . The microscopy system of claim 4 , wherein the different NAILS correspond to different types of DUTs.
6 . The microscopy system of claim 5 , wherein the different types of DUTs are different types of radiused end connectors.
7 . A microscopy system for inspection of an end connector of a fiber optic cable, comprising:
a controller;
an imager operably connected to the controller to image an end connector;
a light source operably connected to the controller to provide illumination;
a diffuser to receive and diffuse the illumination from the light source, and to project the diffused illumination;
a beamsplitter to receive and reflect the diffused illumination;
an objective to receive and project the reflected diffused illumination upon the end connector, wherein either the diffuser or an image of the diffuser is disposed at the back focal plane of the objective; and
a storage to store machine-readable instructions that, when executed by the controller, cause the controller to:
control the light source to provide the illumination to the diffuser such that the reflected diffused illumination provides Köhler illumination to the end connector;
control the imager to perform imaging of the end connector by receiving reflected light from the Köhler illumination of the end connector; and
when the end connector is a radiused end connector, control the light source to provide the illumination to the diffuser such that a numerical aperture of illumination (NA IL ) of the radiused end connector is greater than a numerical aperture of imaging (NA IM ) of the radiused end connector.
8 . The microscopy system of claim 7 , wherein, when the end connector is a radiused end connector, the controller is further to control the light source to provide a lighting pattern to illuminate the diffuser, and
wherein the lighting patterns corresponds to a NA IL which corresponds to the radiused end connector.
9 . The microscopy system of claim 8 , wherein the storage is further to store different lighting patterns that correspond to different NAILS which correspond to different types of radiused end connectors.
10 . The microscopy system of claim 8 , wherein the light source comprises:
an array of light sources to illuminate the diffuser.
11 . The microscopy system of claim 10 , wherein the light pattern comprises:
a spatial pattern of the array of light sources, wherein the spatial pattern comprises a pattern of lit and unlit light sources in the array of light sources.
12 . The microscopy system of claim 10 , wherein the controller is further to control the array of light sources to provide the lighting pattern by controlling one or more light sources in the array of light sources to at least one of turn on, turn off, change intensity, change wavelength, or change polarity.
13 . The microscopy system of claim 10 , wherein the array of light sources comprises:
a circular array of light emitting diodes (LEDs).
14 . The microscopy system of claim 7 , wherein either the diffuser or an image of the diffuser is disposed at the back focal plane of the objective to provide Köhler illumination to the end connector.
15 . A method for viewing, by a microscopy system, an end connector of a fiber optic cable, comprising:
(a) changing, by a controller, one or more parameters of an array of light sources, wherein the array of light sources provides illumination to a diffuser which projects diffused illumination to reflect off of a beamsplitter through an objective to illuminate an end connector;
(b) controlling, by the controller, an imager to capture an image corresponding to the changed one or more parameters;
(c) analyzing, by the controller, the captured image to determine if a condition for viewing is met;
(d) when the condition for viewing is not met, repeating steps (a), (b), and (c); and
(e) when the condition for viewing is met, maintaining a lighting pattern of the array of light sources with the one or more parameters which provided the illumination for the image which met the condition for viewing,
wherein the condition for viewing comprises at least one of (i) a threshold for one or more of imaging, inspection, or examination; (ii) a user-entered goal or parameter; or (iii) a timeout, wherein step (e) is performed after a specific number of iterations of step (d).
16 . The method of claim 15 , further comprising, after step (e):
providing, by the controller, feedback indicating the end connector may be viewed.
17 . The method of claim 15 , further comprising, before step (a):
receiving, by the controller, input indicating how the one or more parameters are to be changed in step (a).
18 . The method of claim 15 , wherein the controller automatically determines how the one or more parameters are to be changed in step (a).
19 . The method of claim 15 , further comprising, after step (e):
storing, by the controller, the lighting pattern which met the condition for viewing for the end connector in a storage.
20 . The method of claim 15 , further comprising, after step (e):
(f) controlling, by the controller, the imager to capture an image corresponding to the lighting pattern; and
(g) storing, by the controller, the captured image.