METHOD AND SYSTEM FOR IMAGE EVALUATION OF NEAR-EYE DISPLAYS

1 . A method for image evaluation of a near-eye display (NED), comprising:

dividing a full view field of the NED into a plurality of sub-view-fields;

obtaining a plurality of sub-images corresponding to the plurality of sub-view-fields;

synthesizing the plurality of sub-images to obtain a full image; and

evaluating the full image to determine if it contains at least one visual artefact or nonuniformity distribution.

2 . The method according to claim 1 , wherein dividing a full view field of the NED into a plurality of sub-view-fields further comprises:

generating a plurality of sub-test patterns for a full test pattern; and

obtaining, by the NED, a plurality of sub-virtual images corresponding to the plurality of sub-test patterns, wherein the plurality of sub-virtual images correspond to the plurality of sub-view-fields.

3 . The method according to claim 2 , wherein obtaining the plurality of sub-images corresponding to the plurality of sub-view-fields further comprises:

performing one of the generated sub-test patterns;

rendering, by the NED, a sub-virtual image for the sub-test patterns and capturing the sub-virtual image; and

repeating the rendering and the capturing until all the plurality of sub-test patterns have been performed.

4 . The method according to claim 1 , wherein the sub-image is obtained by a light measuring device (LMD).

5 . The method according to claim 1 , wherein evaluating the full image to determine if it contains at least one visual artefact further comprises:

obtaining an optical characteristic of the full image; and

detecting the visual artefact based on the optical characteristics.

6 . The method according to claim 5 , wherein the optical characteristic comprises luminance and/or chromaticity.

7 . The method according to claim 1 , wherein the plurality of sub-images are partially overlapped.

8 . The method according to claim 1 , wherein a shape of the sub-view-field is a rectangle, a square, or a circle.

9 . A system for image evaluation of a near-eye display (NED), comprising:

a light measuring device (LMD) configured to:

obtain a plurality of sub-images corresponding to a plurality of sub-view-fields displayed by the NED; and

evaluate a full image to determine if it contains at least one visual artefact or nonuniformity distribution; and

a processor configured to:

synthesize the plurality of sub-images to obtain the full image;

wherein a full view field of the NED is divided into the plurality of sub-view-fields.

10 . The system according to claim 9 , wherein the processor is further configured to generate a plurality of sub-test patterns for a full test pattern; and obtain a plurality of sub-virtual images corresponding to the plurality of sub-test patterns, wherein the plurality of sub-virtual images correspond to the plurality of sub-view-fields.

11 . The system according to claim 10 , wherein the NED is further configured to render a sub-virtual image for a sub-test pattern; the LMD is configured to capture the sub-virtual image to obtain the sub-image; and the system further comprises a driver configured to control the NED and LMD to repeat the rendering and the capturing until all the plurality of sub-test patterns have been performed.

12 . The system according to claim 9 , wherein the LMD is further configured to:

obtain an optical characteristic of the full image; and

detect the visual artefact based on the optical characteristics.

13 . The system according to claim 12 , wherein the optical characteristic comprises luminance.

14 . The system according to claim 12 , wherein the optical characteristic comprises chromaticity.

15 . The system according to claim 9 , wherein the plurality of sub-images are partially overlapped.

16 . The system according to claim 9 , wherein a shape of the sub-view-field is a rectangle, a square, or a circle.