Shallow Trench Isolation using Porous Semiconductor
Fabrication methods and structures for forming integrated circuit (IC) porous semiconductor (π-Semi) isolation structures such as shallow trench isolation (STI) and/or deep trench isolation (DTI) structures. The methods speed up IC front-end-of-line processing and decrease the cost of IC fabrication. In general, exposed portions of a semiconductor layer are subjected to an electrochemical etching to form π-Semi isolation structures; in essence, the in situ semiconductor is restructured to π-Semi. The characteristics of π-Semi, particularly mesoporous π-Semi and microporous π-Semi, include good electrical insulation as well as hole trapping capability. Accordingly, π-Semi used for STI and/or DTI structures provides excellent electrical isolation. A first embodiment comprises a “pre-FET” π-Semi isolation structure, fabricated before formation of gate, drain, and source structures or regions of a field-effect transistor (FET). A second embodiment comprises a “post-FET” π-Semi isolation structure, fabricated after formation of gate, drain, and source structures or regions of a FET.
1 . An integrated circuit including at least one porous semiconductor isolation structure.
2 . The invention of claim 1 , wherein the at least one porous semiconductor isolation structure includes a protective cap.
3 . The invention of claim 1 , wherein the at least one porous semiconductor isolation structure includes a protective cap of recrystallized semiconductor.
4 . The invention of claim 1 , wherein the at least one porous semiconductor isolation structure comprises microporous semiconductor.
5 . The invention of claim 1 , wherein the at least one porous semiconductor isolation structure comprises mesoporous semiconductor.
6 . An integrated circuit including at least one transistor structure surrounded by a porous semiconductor isolation structure.
7 . The invention of claim 6 , wherein the at least one porous semiconductor isolation structure includes a protective cap.
8 . The invention of claim 6 , wherein the at least one porous semiconductor isolation structure includes a protective cap of recrystallized semiconductor.
9 . The invention of claim 6 , wherein the at least one porous semiconductor isolation structure comprises microporous semiconductor.
10 . The invention of claim 6 , wherein the at least one porous semiconductor isolation structure comprises mesoporous semiconductor.
11 . A method of forming integrated circuit porous semiconductor isolation structures, including:
(a) patterning a layer of semiconductor to define areas of semiconductor where at least one porous semiconductor isolation structure is to be formed;
(b) forming at least one porous semiconductor isolation structure within the defined areas of semiconductor;
(c) forming a protective cap for each porous semiconductor isolation structure; and
(d) forming transistor structures in and/or on regions of the layer of semiconductor each surrounded by a respective porous semiconductor isolation structure.
12 . The method of claim 11 , wherein forming the protective cap for the at least one porous semiconductor isolation structure includes rearranging or converting the atomic structure of the porous semiconductor near the top of porous semiconductor isolation structure into crystalline semiconductor.
13 . The method of claim 11 , wherein forming at least one porous semiconductor isolation structure is by electrochemically etching the defined areas of semiconductor.
14 . The method of claim 13 , wherein electrochemically etching the defined areas of semiconductor is by anodic dissolution of crystalline semiconductor within the defined areas of semiconductor.
15 . The method of claim 13 , wherein electrochemically etching the defined areas of semiconductor is by anodic dissolution of crystalline semiconductor within the defined areas of semiconductor using hydrofluoric acid based electrolytes.
16 . The method of claim 11 , wherein the at least one porous semiconductor isolation structure comprises microporous semiconductor.
17 . The method of claim 11 , wherein the at least one porous semiconductor isolation structure comprises mesoporous semiconductor.
18 .- 39 . (canceled)