Ejection head nozzle flooding control
A nozzle plate configured for a fluid ejection head, a fluid ejection head containing the nozzle plate and a method for modifying a nozzle plate to reduce fluid flooding thereon. The nozzle plate includes a plurality of nozzle holes therein attached to a flow feature layer on a semiconductor substrate, and includes a first hydrophobic region surrounding each of the plurality of nozzle holes, whereby the first hydrophobic region is configured to reduce flooding of the nozzle plate.
1 . A nozzle plate configured for a fluid ejection head, the nozzle plate comprises a plurality of nozzle holes therein attached to a flow feature layer on a semiconductor substrate, wherein the nozzle plate further comprises
(i) a first hydrophobic region surrounding each of the plurality of nozzle holes, the first hydrophobic region having a thickness of from 3 μm to 10 μm,
(ii) a hydrophilic region adjacent to the first hydrophobic region, and
(iii) a raised second hydrophobic region over the hydrophilic region, the raised second hydrophobic region having a thickness of from 1 μm to 2.5 μm,
wherein the raised second hydrophobic region comprises a channel therein in fluid flow communication with the first hydrophobic region surrounding each of the plurality of nozzle holes, and the channel is configured to channel fluid away from each of the plurality of nozzle holes through the raised second hydrophobic region.
2 . The nozzle plate of claim 1 , wherein the channel is wedge-shaped.
3 . A fluid ejection head comprising the nozzle plate of claim 1 .
4 . The nozzle plate of claim 1 , wherein the hydrophilic region has the same thickness as the first hydrophobic region.
5 . A fluid ejection head comprising:
a semiconductor substrate containing a plurality of fluid ejectors thereon, a flow feature layer attached to the semiconductor substrate, and a nozzle plate containing a plurality of nozzle holes therein attached to the flow feature layer on a semiconductor substrate, wherein the nozzle plate contains
(i) a first hydrophobic region surrounding each of the plurality of nozzle holes, the first hydrophobic region having a thickness of from 3 μm to 10 μm,
(ii) a hydrophilic region adjacent to the first hydrophobic region, and
(iii) a raised second hydrophobic region over the hydrophilic region, the raised second hydrophobic region having a thickness of from 1 μm to 2.5 μm,
wherein the raised second hydrophobic region comprises a channel therein in fluid flow communication with the first hydrophobic region surrounding each of the plurality of nozzle holes, and the channel is configured to channel fluid away from each of the plurality of nozzle holes through the raised second hydrophobic region.
6 . The fluid ejection head of claim 5 , wherein the channel is wedge-shaped.
7 . A fluid ejection device comprising the fluid ejection head of claim 5 .
8 . The fluid ejection head of claim 5 , wherein the hydrophilic region has the same thickness as the first hydrophobic region.