Method for inspecting a power storage device, method for manufacturing a power storage device, and method for manufacturing a device stack
A method for inspecting a battery in which an electrode body is accommodated in a case so that the electrode body is insulated from the case by an insulation film includes: adjusting the battery to a first voltage; measuring a first potential difference which is a potential difference between the case and a negative terminal that is exposed outside the case and electrically connected to a negative electrode plate to have a negative-electrode potential; measuring a second potential difference which is a potential difference between the case and the negative electrode plate after a lapse of a standby period of 24 hours or more; and determining whether or not a short circuit exists between the case and the negative electrode plate based on magnitude of the first and second potential differences and a change between the first potential difference and the second potential difference.
1. A method for inspecting a power storage device comprising a metal case, an electrode body including a positive electrode plate and a negative electrode plate located outside the positive electrode plate in a thickness direction of the positive electrode plate, and an insulation film covering the electrode body to insulate the electrode body from the metal case, the method comprising:
adjusting the power storage device to a first device voltage by charging or discharging the power storage device;
measuring a first potential difference at a first potential difference measuring time after adjusting the power storage device to the first device voltage, the first potential difference being a case-to-negative electrode potential difference generated between the metal case and a negative-electrode potential member that is exposed outside the metal case and is electrically connected to the negative electrode plate to have a negative-electrode potential;
measuring a second potential difference, which is the case-to-negative electrode potential difference, at a second potential difference measuring time after a lapse of a standby period of 24 hours or more from the first potential difference measuring time; and
determining whether or not a case-to-negative electrode short circuit exists between the metal case and the negative electrode plate based on a magnitude of the first potential difference, a magnitude of the second potential difference, and a variation between the first potential difference and the second potential difference.
2. A method for manufacturing a power storage device, comprising the method for inspecting a power storage device according to claim 1 ,
wherein adjusting the power storage device to the first device voltage is to adjust the power storage device to the first device voltage by charging or discharging the power storage device that has undergone initial charge and subsequent charge and discharge, and
measuring the first potential difference, measuring the second potential difference, and determining the case-to-negative electrode short circuit are performed on the power storage device in an individual state.
3. The method for manufacturing a power storage device according to claim 2 , further comprising inspecting a self-discharging state of the power storage device after adjusting the power storage device to the first device voltage,
wherein measuring the first potential difference and measuring the second potential difference are performed within inspecting the self-discharging state.
4. The method for manufacturing a power storage device according to claim 3 , wherein
inspecting the self-discharging state includes:
measuring a pre-leaving device voltage of the power storage device after adjusting the power storage device to the first device voltage;
leaving the power storage device, for which the pre-leaving device voltage has been measured, for a leaving period with terminals in an open state;
measuring a post-leaving device voltage of the power storage device after leaving the power storage device;
checking a self-discharging state of the power storage device using the pre-leaving device voltage and the post-leaving device voltage of the power storage device;
after adjusting the power storage device to the first device voltage but before leaving the power storage device, measuring the first potential difference to be performed in parallel with, before, or after measuring the pre-leaving device voltage; and
after leaving the power storage device but before checking the self-discharging state, measuring the second potential difference to be performed in parallel with, before, or after measuring the post-leaving device voltage, and
the standby period overlaps the leaving period.
5. A method for manufacturing a device stack in which a plurality of the power storage devices are stacked while being insulated from each other, and restrained in a stacking direction by a restraining member, forming a plurality of restrained devices, and the restrained devices are connected with each other,
the method comprising:
restraining the power storage devices while insulating them from each other, using the restraining member, to constitute an unconnected device stack including the restrained devices that are unconnected with each other, and
wherein the method includes the method for inspecting a power storage device according to claim 1 , wherein
adjusting the power storage device to the first device voltage is to adjust the power storage devices to the first device voltage by charging or discharging the power storage devices that have undergone initial charge and subsequent charge and discharge, before restraining the power storage devices, and
measuring the first potential difference, measuring the second potential difference, and determining the case-to-negative electrode short circuit are performed on each of the restrained devices that constitute the unconnected device stack, after restraining the power storage devices.
6. The method for manufacturing a device stack according to claim 5 , further comprising inspecting an in-stack self-discharging state of each of the restrained devices that constitute the unconnected device stack,
wherein measuring the first potential difference and measuring the second potential difference are performed within inspecting the in-stack self-discharging state.
7. The method for manufacturing a device stack according to claim 6 , wherein
inspecting the in-stack self-discharging state includes:
measuring a restraint pre-leaving device voltage of each of the restrained devices after restraining the power storage devices;
leaving the restrained devices, for each of which the restraint pre-leaving device voltage has been measured, for a restraint leaving period with terminals in an open state;
measuring a restraint post-leaving device voltage of each of the restrained devices after leaving the restrained devices;
checking a restraint self-discharging state of each of the restrained devices using the restraint pre-leaving device voltage and the restraint post-leaving device voltage of the corresponding restrained device;
after restraining the storage devices but before leaving the restrained devices, measuring the first potential difference to be performed in parallel with, before, or after measuring the restraint pre-leaving device voltage; and
after leaving the restrained devices but before checking the restraint self-discharging state, measuring the second potential difference to be performed in parallel with, before, or after measuring the restraint post-leaving device voltage, and
the standby period overlaps the restraint leaving period.