MEASURING METHOD AND MEASURING DEVICE
According to one embodiment, a measuring method includes forming a partition including a lower portion arranged on a base and an upper portion protruding from a side surface of the lower portion, acquiring a first image generated by detecting a secondary electron generated by emitting an electron beam including a primary electron to an area including at least a part of the side surface of the lower portion and at least a part of an end portion of the upper portion, analyzing the first image, and measuring an amount of protrusion by which the end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.
1 . A measuring method comprising:
forming a partition including a lower portion arranged on a base and an upper portion protruding from a side surface of the lower portion;
acquiring a first image generated by detecting a secondary electron generated by emitting an electron beam including a primary electron to an area including at least a part of the side surface of the lower portion and at least a part of an end portion of the upper portion from a second direction inclined from a first direction perpendicular to the base;
analyzing the acquired first image; and
measuring an amount of protrusion by which the end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.
2 . The measuring method of claim 1 , wherein
the electron beam is emitted toward a surface on a side opposite to the base of the upper portion,
the analyzing includes identifying a first pixel corresponding to an end portion on the base side of the side surface of the lower portion, and a second pixel corresponding to an end portion of a shadow generated by the upper portion, based on luminance values of a plurality of pixels constituting the first image, and
the measuring includes measuring the amount of protrusion based on the number of pixels arranged between the identified first and second pixels.
3 . The measuring method of claim 2 , wherein
the measuring includes converting the number of pixels into a length of a shadow generated by the upper portion, based on conversion information indicating a length corresponding to one pixel, and measuring the amount of protrusion based on the length of the shadow converted from the number of pixels, and
the conversion information is prepared in advance based on a second image generated by detecting a secondary electron generated by emitting an electron beam including a primary electron to a sample whose size is already known.
4 . The measuring method of claim 2 , wherein
the measuring includes acquiring the amount of protrusion output from a machine learning model by inputting the number of pixels arranged between the identified first and second pixels to the machine learning model, the machine learning model being generated by learning a data set prepared in advance, and
the data set includes the number of pixels arranged between the first and second pixels identified from a third image generated by detecting a secondary electron generated by emitting the electron beam including the primary electron to the area including at least a part of the side surface of the lower portion included in the partition from which the amount of protrusion is already known and at least a part of the end portion of the upper portion included in the partition, and the already known amount of protrusion.
5 . The measuring method of claim 1 , wherein
the electron beam is emitted toward a surface on the base side of the upper portion,
the analyzing includes identifying a first pixel corresponding to an end portion on a side opposite to the base side of the side surface of the lower portion, and a second pixel corresponding to an end portion of the upper portion, based on luminance values of a plurality of pixels constituting the first image, and
the measuring includes measuring the amount of protrusion based on the number of pixels arranged between the identified first and second pixels.
6 . A measuring method comprising:
forming an insulating layer arranged on a base;
forming a lower electrode arranged on the insulating layer;
forming a rib which covers a part of the lower electrode and which includes an aperture overlapping with the lower electrode;
forming a partition including a lower portion arranged on the rib and an upper portion protruding from a side surface of the lower portion;
acquiring a first image generated by detecting a secondary electron generated by emitting an electron beam including a primary electron to an area including at least a part of the side surface of the lower portion and at least a part of an end portion of the upper portion from a second direction inclined from a first direction perpendicular to the base;
analyzing the acquired first image; and
measuring an amount of protrusion by which the end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.
7 . The measuring method of claim 6 , wherein
the lower portion is formed of a first metal material, and
the upper portion is formed of a second metal material different from the first metal material.
8 . The measuring method of claim 7 , wherein
the first metal material includes aluminum or an aluminum alloy, and
the second metal material includes titanium.
9 . The measuring method of claim 6 , wherein
the electron beam is emitted toward a surface on a side opposite to the base of the upper portion,
the analyzing includes identifying a first pixel corresponding to an end portion on the base side of the side surface of the lower portion, and a second pixel corresponding to an end portion of a shadow generated by the upper portion, based on luminance values of a plurality of pixels constituting the first image, and
the measuring includes measuring the amount of protrusion based on the number of pixels arranged between the identified first and second pixels.
10 . The measuring method of claim 9 , wherein
the measuring includes converting the number of pixels into a length of a shadow generated by the upper portion, based on conversion information indicating a length corresponding to one pixel, and measuring the amount of protrusion based on the length of the shadow converted from the number of pixels, and
the conversion information is prepared in advance based on a second image generated by detecting a secondary electron generated by emitting an electron beam including a primary electron to a sample whose size is already known.
11 . The measuring method of claim 9 , wherein
the measuring includes acquiring the amount of protrusion output from a machine learning model by inputting the number of pixels arranged between the identified first and second pixels to the machine learning model, the machine learning model being generated by learning a data set prepared in advance, and
the data set includes the number of pixels arranged between the first and second pixels identified from a third image generated by detecting a secondary electron generated by emitting the electron beam including the primary electron to the area including at least a part of the side surface of the lower portion included in the partition from which the amount of protrusion is already known and at least a part of the end portion of the upper portion included in the partition, and the already known amount of protrusion.
12 . The measuring method of claim 6 , wherein
the electron beam is emitted toward a surface on the base side of the upper portion,
the analyzing includes identifying a first pixel corresponding to an end portion on a side opposite to the base side of the side surface of the lower portion, and a second pixel corresponding to an end portion of the upper portion, based on luminance values of a plurality of pixels constituting the first image, and
the measuring includes measuring the amount of protrusion based on the number of pixels arranged between the identified first and second pixels.
13 . The measuring method of claim 6 , further comprising:
forming an organic layer which is in contact with the lower electrode through the aperture after measuring the amount of protrusion; and
forming an upper electrode arranged on the organic layer.
14 . The measuring method of claim 13 , further comprising:
forming a cap layer arranged on the upper electrode; and
forming a sealing layer arranged on the cap layer.
15 . The measuring method of claim 6 , wherein
the insulating layer is formed of an organic material, and
the rib is formed of an inorganic material.
16 . A measuring device comprising:
an emission unit configured to emit an electron beam including a primary electron to an area including at least a part of side surface of a lower portion and at least a part of an end portion of an upper portion protruding from the side surface of the lower portion from a second direction inclined from a first direction perpendicular to a base where a partition including the lower portion and the upper portion;
a detector configured to detect a secondary electron generated by the emission of the electron beam;
an acquisition unit configured to acquire a first image generated by detection data from the detector;
an analysis unit configured to analyze the acquired first image; and
a measuring unit configured to measure an amount of protrusion by which the end portion of the upper portion protrudes from the side surface of the lower portion, based on the analysis result.
17 . The measuring device of claim 16 , wherein
the electron beam is emitted toward a surface on a side opposite to the base of the upper portion,
the analysis unit is configured to identify a first pixel corresponding to an end portion on the base side of the side surface of the lower portion, and a second pixel corresponding to an end portion of a shadow generated by the upper portion, based on luminance values of a plurality of pixels constituting the first image, and
the measuring unit is configured to measure the amount of protrusion, based on the number of pixels arranged between the identified first and second pixels.
18 . The measuring device of claim 17 , wherein
the measuring unit is configured to convert the number of pixels into a length of a shadow generated by the upper portion, based on conversion information indicating a length corresponding to one pixel, and measure the amount of protrusion, based on the length of the shadow converted from the number of pixels, and
the conversion information is prepared in advance based on a second image generated by detecting a secondary electron generated by emitting an electron beam including a primary electron to a sample whose size is already known.
19 . The measuring device of claim 17 , wherein
the measuring unit is configured to acquire the amount of protrusion output from a machine learning model by inputting the number of pixels arranged between the identified first and second pixels to the machine learning model, the machine learning model being generated by learning a data set prepared in advance, and
the data set includes the number of pixels arranged between the first and second pixels identified from a third image generated by detecting a secondary electron generated by emitting the electron beam including the primary electron to the area including at least a part of the side surface of the lower portion included in the partition from which the amount of protrusion is already known and at least a part of the end portion of the upper portion included in the partition, and the already known amount of protrusion.
20 . The measuring device of claim 16 , wherein
the electron beam is emitted toward a surface on the base side of the upper portion,
the analysis unit is configured to identify a first pixel corresponding to an end portion on a side opposite to the base side of the side surface of the lower portion, and a second pixel corresponding to an end portion of the upper portion, based on luminance values of a plurality of pixels constituting the first image, and
the measuring unit is configured to measure the amount of protrusion, based on the number of pixels arranged between the identified first and second pixels.