SYSTEM FOR ANALYZING A SAMPLE
A system for analyzing a sample, wherein the sample is an air composition or an aerosol, includes: a sample preparation unit, including a sample inlet and a plasma torch, wherein the sample enters the system through the sample inlet, wherein the plasma torch is configured to produce a plasma, which ionizes the sample such that ions and/or photons are generated, wherein the plasma is configured to aspirate the sample through the sample inlet; an interface configured to guide the generated ions and/or photons towards a detector; the detector, which is configured to detect the generated ions and/or photons; and an evaluation unit configured to analyze the sample by means of the detected ions and/or photons.
1 . A system for analyzing a sample, wherein the sample is an air composition or an aerosol, the system comprising:
a sample preparation unit, including a sample inlet and a plasma torch, configured such that the sample enters the system via the sample inlet, wherein the plasma torch is configured to produce a plasma that ionizes the sample such that ions and/or photons are generated, wherein the plasma is adapted to aspirate the sample through the sample inlet;
a detector configured to detect the generated ions and/or photons;
an interface configured to guide the generated ions and/or photons from the sample preparation unit towards the detector; and
an evaluation unit configured to analyze the sample using the detected ions and/or photons.
2 . The system according to claim 1 , further comprising a sample introduction unit configured to introduce the sample into the sample inlet.
3 . The system according to claim 2 , wherein the sample introduction unit comprises a transport apparatus, which is configured to transport the sample towards the sample inlet, and a connecting unit, which is connectable to the sample inlet.
4 . The system according to claim 2 , wherein the sample comprises particles, wherein the sample introduction unit comprises a belt conveyor, a dosage controller and a connecting unit, wherein the belt conveyor is configured to be loaded with the particles and to move the particles towards the sample inlet, wherein the dosage controller is configured to control the amount of the sample entering the sample inlet through the connecting unit.
5 . The system according to claim 1 , further comprising a classifier, wherein the sample comprises particles, and wherein the classifier is configured to separate smaller particles from larger particles within the sample and to guide the particles having a mass below a predefined upper mass limit to the sample inlet.
6 . The system according to claim 5 , wherein the classifier comprises a container, including an inlet and an outlet, and a tube partially inserted into the container, wherein the outlet is configured to be connectable to the sample inlet, wherein the inlet is connected to an air or gas source, wherein the tube is arranged and configured to flow the sample into the container such that the flow of the sample is opposed to the flow of the particles with a mass below a predefined upper mass limit towards the outlet.
7 . The system according to claim 5 , wherein the classifier comprises a waste collector, which is arranged such that particles with a mass above the predefined upper mass limit are collected in the waste collector.
8 . The system according to claim 5 , wherein the classifier is arranged between the sample introduction unit and the sample inlet.
9 . The system according to claim 1 , wherein the plasma torch is configured to sustain the plasma with air, wherein the air enters the plasma torch through the sample inlet.
10 . The system according to claim 1 , wherein the sample comprises particles, and wherein the evaluation unit is configured to analyze the particles in the sample with regard to their isotopic composition, size, concentration and/or number.
11 . The system according to claim 1 , wherein the sample inlet is arranged upstream of the plasma torch relative to a direction of a flow of the sample and of the generated ions and/or photons through the system.
12 . The system according to claim 1 , wherein the interface comprises a mass-analyzer and/or a wavelength selector.
13 . The system according to claim 1 , wherein the system is embodied as a microwave inductively coupled atmospheric plasma mass spectrometer, a microwave inductively coupled atmospheric plasma optical emission spectrometer, a radio-frequency inductively coupled mass spectrometer, radio-frequency inductively coupled optical spectrometer, a glow discharge mass spectrometer, or a glow discharge optical spectrometer.
14 . The system according to claim 1 , wherein the sample is produced by removal of material from a surface or object.
15 . The system according to claim 1 , wherein the sample is ambient air.