TEST CLIP AND TESTING ASSEMBLY
Provided are a test clip and a testing assembly and relates to the technical field of voltage testing. The test clip includes a clip body and a base. The clip body is configured to clamp a piece under test. The base is connected to the clip body, and the base is configured to be detachably connected to a crimp probe head to achieve an electrical connection between the crimp probe head and the clip body. The test clip is divided into the clip body and the base connected to each other. The clip body is configured to clamp the piece under test, and the base is configured to be detachably connected to the crimp probe head to achieve the electrical connection between the crimp probe head and the clip body, so that the piece under test can be clamped by the clip body for testing.
1 . A test clip, comprising:
a clip body; and
a base connected to the clip body, wherein the base is configured to be detachably connected to a crimp probe head to achieve an electrical connection between the crimp probe head and the clip body.
2 . The test clip according to claim 1 , wherein the base has a first inserting portion, and the first inserting portion is configured to fit with the crimp probe head in an insertion manner.
3 . The test clip according to claim 2 , wherein the first inserting portion is a jack.
4 . The test clip according to claim 3 , wherein one of an inner wall of the jack and the crimp probe head is provided with a snap-fit portion, and the other is provided with a snap-fit groove; wherein
the snap-fit portion is configured to be snap fitted into the snap-fit groove after the crimp probe head is inserted into the jack.
5 . The test clip according to claim 4 , wherein the snap-fit groove is a ring groove or the snap-fit groove is a non-closed structure in a circumferential direction of the jack.
6 . The test clip according to claim 3 , wherein the jack is a threaded hole.
7 . The test clip according to claim 3 , wherein the crimp probe head comprises a second inserting portion and a probe, wherein the second inserting portion is configured to fit with the jack in an insertion manner, the second inserting portion has an insertion end to be inserted into the jack, and a probe partially protrudes from the insertion end; and
the jack has a bottom wall, and the bottom wall is used to abut against a part of the probe protruding from the insertion end after the second inserting portion is inserted into the jack, so as to achieve an electrical connection between the probe and the clip body.
8 . The test clip according to claim 3 , wherein the base is cylindrical, and the base is coaxial with the jack.
9 . The test clip according to claim 3 , wherein the clip body is connected to one end of the base, and the jack is provided at the other end of the base and recessed toward a direction approaching the clip body.
10 . The test clip according to claim 1 , wherein the clip body comprises a first clamping portion and a second clamping portion, wherein the first clamping portion is hinged to the second clamping portion, the first clamping portion and the second clamping portion are configured to cooperate to clamp a piece under test, and the base is connected to one end of the first clamping portion or one end of the second clamping portion.
11 . A testing assembly, comprising:
the test clip according to claim 1 ;
a tester; and
a crimp probe head electrically connected to the tester, wherein the crimp probe head is configured to be detachably connected to the base to achieve an electrical connection between the crimp probe head and the clip body.