IP Library Granted Patent US 12,487,160
Granted Patent B2
US 12,487,160 · App. 18/479,929 · Granted Dec 2, 2025

Surface density measurement method, surface density measurement system, and computer device

Inventors: Liangjie Yan (Ningde, CN); Qian Wu (Ningde, CN)
Assignee: CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
G01N9/24H01M4/04
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Quick Facts
Patent No.
US 12,487,160
App. No.
18/479,929
Granted
Dec 2, 2025
Kind
B2
Abstract

A surface density measurement method includes: obtaining a single-sided-electrode-plate transverse scan result by performing a ray source-based transverse scan on a single-sided electrode plate, where the single-sided-electrode-plate transverse scan result includes a blank zone scan result of a blank zone of the single-sided electrode plate and a single-side coating zone scan result of the single-sided electrode plate; obtaining a double-sided-electrode-plate transverse scan result by performing a ray source-based transverse scan on a double-sided electrode plate, where the double-sided electrode plate is an electrode plate obtained by coating the single-sided electrode plate, and the double-sided-electrode-plate transverse scan result includes a double-side coating zone scan result of the double-sided electrode plate; and obtaining surface densities of the electrode plate by analyzing the single-sided-electrode-plate transverse scan result and the double-sided-electrode-plate transverse scan result.

Claims (27)

1 . A surface density measurement method, comprising:

obtaining a single-sided-electrode-plate transverse scan result by performing a ray source-based transverse scan on a single-sided electrode plate, wherein the single-sided-electrode-plate transverse scan result comprises a blank zone scan result of a blank zone of the single-sided electrode plate and a single-side coating zone scan result of the single-sided electrode plate;

obtaining a double-sided-electrode-plate transverse scan result by performing a ray source-based transverse scan on a double-sided electrode plate, wherein the double-sided electrode plate is an electrode plate obtained by coating the single-sided electrode plate, and the double-sided-electrode-plate transverse scan result comprises a double-side coating zone scan result of the double-sided electrode plate; and

obtaining surface densities of the electrode plate by analyzing the single-sided-electrode-plate transverse scan result and the double-sided-electrode-plate transverse scan result.

2 . The method according to claim 1 , wherein the single-sided-electrode-plate transverse scan result is a result obtained by performing a transverse scan on the single-sided electrode plate dried, and the double-sided-electrode-plate transverse scan result is a result obtained by performing the transverse scan on the double-sided electrode plate dried.

3 . The method according to claim 1 , wherein the single-sided-electrode-plate transverse scan result is a result obtained by performing a transverse scan on the single-sided electrode plate by using a narrow spot ray source, and the double-sided-electrode-plate transverse scan result is a result obtained by performing the transverse scan on the double-sided electrode plate by using a narrow spot ray source.

4 . The method according to claim 3 , wherein a width of the narrow spot ray source is smaller than a tab width of a tab of the electrode plate.

5 . The method according to claim 1 , further comprising:

obtaining, by analyzing the single-sided-electrode-plate transverse scan result and the double-sided-electrode-plate transverse scan result, an identification result of whether the single-sided electrode plate and/or double-sided electrode plate has a surface anomaly.

6 . The method according to claim 1 , wherein obtaining the single-sided-electrode-plate transverse scan result by performing the ray source-based transverse scan on the single-sided electrode plate comprises:

obtaining a first scan result by performing the ray source-based transverse scan on the single-sided electrode plate;

analyzing the first scan result to identify a single-sided-electrode-plate blank zone width of a blank zone of the single-sided electrode plate and a single-side coating zone width of the single-sided electrode plate; and

obtaining the single-sided-electrode-plate transverse scan result based on the first scan result, the single-sided-electrode-plate blank zone width, and the single-side coating zone width.

7 . The method according to claim 1 , wherein obtaining the double-sided-electrode-plate transverse scan result by performing the ray source-based transverse scan on the double-sided electrode plate comprises:

obtaining a second scan result by performing the ray source-based transverse scan on the double-sided electrode plate;

analyzing the second scan result to identify a double-sided-electrode-plate blank zone width of a blank zone of the double-sided electrode plate and a double-side coating zone width of the double-sided electrode plate; and

obtaining the double-sided-electrode-plate transverse scan result based on the second scan result, the double-sided-electrode-plate blank zone width, and the double-side coating zone width.

8 . A computer device comprising:

a processor; and

a memory storing a computer program that, when executed by the processor, enables the processor to perform the method according to claim 1 .

9 . A non-transitory computer-readable storage medium storing a computer program that, when executed by a processor, enables the processor to perform the method according to claim 1 .

10 . A surface density measurement system, comprising:

two rack scanners;

wherein one of the rack scanners is disposed at a position through which a single-sided electrode plate passes, another of the rack scanners is disposed at a position through which a double-sided electrode plate passes, the double-sided electrode plate is an electrode plate obtained by coating the single-sided electrode plate, each of the rack scanners performs a transverse scan on a blank zone and a coated zone of the electrode plate passing through the rack scanner, and surface densities of the electrode plate are obtained based on the transverse scan results of the two rack scanners.

11 . The system according to claim 10 , wherein one of the rack scanners is disposed at a position through which the single-sided electrode plate dried passes, and the other of the rack scanners is disposed at a position through which the double-sided electrode plate dried passes.

12 . The system according to claim 10 , wherein a ray source of the rack scanner is a narrow spot ray source.

13 . The system according to claim 12 , wherein a width of the narrow spot ray source is smaller than a tab width of a tab of the electrode plate.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 6, 2024
From: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
To: CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
Reel/Frame 068338/0402 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 3, 2023
From: YAN, LIANGJIE; WU, QIAN
To: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Reel/Frame 065104/0808 →
Priority Claims (1)
CN 202211069810.3 · Sep 2, 2022 · national
Continuity (2)
Continuation PCTCN2023092542 · May 6, 2023
Related Publication 20240077397A1 · Mar 7, 2024
References Cited (20)
US 20140295068A1 · Nanba · 2014 [cited by examiner]
US 20210104719A1 · Oikawa · 2021 [cited by examiner]
US 20210244374A1 · Zhao · 2021 [cited by examiner]
US 20240021830A1 · Kim · 2024 [cited by examiner]
US 20240339584A1 · Jang · 2024 [cited by examiner]
US 20250006984A1 · Visco · 2025 [cited by examiner]
CN 102967529A · 2013 [cited by applicant]
CN 102967529B · 2015 [cited by applicant]
CN 110108239A · 2019 [cited by applicant]
CN 111103213A · 2020 [cited by applicant]
CN 112082901A · 2020 [cited by applicant]
CN 114720324A · 2022 [cited by applicant]
CN 115463764A · 2022 [cited by applicant]
CN 115839902A · 2023 [cited by applicant]
JP 2006090892A · 2006 [cited by applicant]
JP 2007173114A · 2007 [cited by applicant]
JP 2011196755A · 2011 [cited by applicant]
The World Intellectual Property Organization (WIPO) International Search Report for PCT/CN2023/092542 Aug. 14, 2023 5 pages (Including English translation). [cited by applicant]
The European Patent Office (EPO) Extended Search Report for EP Application No. 23782129.3. Aug. 21, 2024 10 Pages. [cited by applicant]
State Intellectual Property Office of China The First Office Action for Application No. 202211069810.3 Jun. 10, 2025 14 pages (including translation). [cited by applicant]