Reflection refuting laser scanner
Some embodiments described herein relate to optical systems and methods for determining the shape and/or size of objects that include projecting a pattern of light onto the object. The pattern of light can be configured such that first-order reflections can be distinguished from second- and/or higher-order reflections, which can be rejected. Thus, even in instances in which the pattern of light is reflected onto the object multiple times, the original, or first-order, reflection can be detected, distinguished, and/or used for laser triangulation. In some embodiments, a pattern of light that does not have reflection and/or rotational symmetry is projected onto the object, such that second-order and/or higher-order reflections can be distinguished from the first-order reflection.
1 . A method comprising:
receiving, via a detection device, an image of an object illuminated by a light source configured to project a light pattern, the object causing first-order reflections and higher-order reflections of the projected light pattern, wherein the image includes the first-order reflections and the higher-order reflections, and wherein the projected light pattern enables identification of the first-order reflections in the image;
performing a comparison based on at least one first-order reflection of the first-order reflections and a geometric attribute of the projected light pattern;
identifying one or more deviations in the first-order reflections based on the comparison; and
generating a model of at least a portion of the object based on identification of the one or more deviations.
2 . The method of claim 1 , wherein the projected light pattern lacks reflection symmetry.
3 . The method of claim 1 , wherein the projected light pattern includes a linear portion and a non-symmetric portion.
4 . The method of claim 3 , wherein the geometric attribute of the projected light pattern includes the linear portion or the non-symmetric portion.
5 . The method of claim 1 , wherein the geometric attribute includes a linear portion of the projected light pattern or a non-symmetric portion of the projected light pattern.
6 . The method of claim 1 , further comprising identifying a shape of at least the portion of the object based on the one or more deviations.
7 . The method of claim 1 , wherein the light source includes a laser light source, and the projected light pattern includes multiple laser lines.
8 . The method of claim 1 , wherein performing the comparison includes comparing the at least one first-order reflection to the geometric attribute of the projected light pattern.
9 . A system, comprising:
a detection device configured to capture an image of an object during illumination of the object with a light pattern projected by a light source, the image includes reflections of the projected light pattern caused by the object; and
a processor communicatively coupled to the detection device, the processor configured to:
receive, from the detection device, image data associated with the image;
perform a comparison based on a first-order reflection of the reflections and a characteristic of the projected light pattern;
identify, based on a result of the comparison, at least one deviation associated with the first-order reflection; and
generate a model of at least a portion of the object based on the identified deviation.
10 . The system of claim 9 , further comprising the light source, wherein the light pattern lacks reflection symmetry.
11 . The system of claim 9 , wherein:
the reflections include:
first-order reflections; and
higher-order reflections of the projected light pattern; and
the higher-order reflections include:
a second-order reflection,
another reflection that has an order greater than the second-order reflection, or
a combination thereof.
12 . The system of claim 9 , wherein the processor is further configured to:
identify the first-order reflection based on the image data;
to perform the comparison based on multiple first-order reflections of the reflections; or
a combination thereof.
13 . The system of claim 9 , wherein, to perform the comparison, the processor is configured to compare the first-order reflection to the characteristic.
14 . The system of claim 9 , wherein the projected light pattern includes a linear portion, a non-symmetric portion, or a combination thereof.
15 . The system of claim 9 , wherein the processor is further configured to identify a shape of at least the portion of the object based on the deviation.
16 . The system of claim 15 , wherein the model is generated based on the identified shape, the model includes a three-dimensional model, or a combination thereof.
17 . A non-transitory processor-readable medium storing code configured to be executed by a processor, the code comprising code to cause the processor to:
receive, from a detection device, image data associated with an image the image including captured by the detection device, the image includes an object illuminated with a light pattern projected by a light source, and wherein the image includes reflections of the projected light pattern caused by the object;
perform a comparison based on a first-order reflection of the reflections and a characteristic of the projected light pattern;
identify, based on a result of the comparison, at least one deviation associated with the first-order reflection; and
generate a model of at least a portion of the object based on the identified deviation.
18 . The non-transitory processor-readable medium of claim 17 , wherein the projected light pattern is configured to enable identification of one or more first-order reflections in the image, the one or more first-order reflections including the first-order reflection.
19 . The non-transitory processor-readable medium of claim 17 , wherein the characteristic of the projected light pattern includes a geometric attribute of the projected light pattern.
20 . The non-transitory processor-readable medium of claim 19 , wherein the geometric attribute includes a linear portion of the projected light pattern or a non-symmetric portion of the projected light pattern.