LASER PROCESSING APPARATUS INCLUDING BEAM ANALYSIS SYSTEM AND METHODS OF MEASUREMENT AND CONTROL OF BEAM CHARACTERISTICS
Numerous embodiments of a laser-processing apparatus are disclosed. In one embodiment, the laser-processing apparatus includes a laser source operative to generate a beam of laser energy, an acousto-optic deflector (AOD) arranged within a beam path, a controller coupled to the AOD, and a beam analysis system operative to measure characteristics of the beam, generate measurement data representative of the measured beam characteristics, and transmit the measurement data to a controller operative to control the operation of the AOD based on that measurement data. In another embodiment, the laser-processing apparatus includes a system for characterization of cross-axis wobble of a galvanometer mirror, comprising a reference laser source configured to emit a reference laser beam, a reflective surface formed on the galvanometer mirror and configured to reflect the reference laser beam to a sensor configured to output a signal representative of the position of the reference beam to a controller.
1 . A laser-processing apparatus, comprising:
a laser source operative to generate a beam of laser energy, wherein the beam of laser energy is propagatable along a beam path;
an acousto-optic deflector (AOD) arranged within the beam path, wherein the AOD is operative to diffract the beam of laser energy;
a controller coupled to the AOD; and
a beam analysis system operative to measure one or more characteristics of the beam of laser energy, generate measurement data representative of one or more of the measured beam characteristics, and transmit the measurement data to the controller,
wherein the controller is operative to control an operation of the AOD based, at least in part, on the measurement data.
2 . The laser-processing apparatus of claim 1 , wherein the characteristic of the beam of laser energy is at least one of pulse repetition rate, beam diameter, spot size, circularity, beam astigmatism, focus height, beam waist, or beam axis position.
3 . The laser-processing apparatus of claim 1 , wherein the AOD includes a pair of AODs operative to diffract the beam path in a first direction and a second direction, respectively.
4 . The laser-processing apparatus of claim 1 , wherein the beam analysis system includes at least one of a camera-based beam profiler, a Rayleigh-scattering beam profiler, and a rotating slit beam profiler.
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7 . The laser-processing apparatus of claim 1 , wherein the controller is operative to control an operation of the AOD to change at least one of the beam diameter, the spot size, the circularity, the astigmatism, the focus height, the beam waist, or the beam axis position of the beam of laser energy.
8 . A method of controlling laser beam characteristics, comprising:
generating a beam of laser energy;
directing, using at least one AOD, the beam of laser energy along a beam path to a beam analysis system;
measuring, using the beam analysis system, one or more characteristics of the beam of laser energy;
generating measurement data representative of one or more of the measured beam characteristics;
transmitting the measurement data from the beam analysis system to a controller; and
outputting control commands from the controller to the at least one AOD based, at least in part, on the measurement data.
9 . The method of claim 8 , wherein one of the one or more beam characteristics is at least one of pulse repetition rate, beam diameter, spot size, circularity, astigmatism, focus height, beam waist, or beam axis position.
10 . The method of claim 8 , wherein the at least one AOD, based on the measurement data is operative to change at least one of a beam diameter, a spot size, a spot position, a circularity, an astigmatism, a focus height, a beam waist, and a beam axis position of the beam of laser energy.
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21 . The method of claim 8 ,
wherein the at least one AOD is operative to change a first characteristic of the beam of laser energy, thereby changing a second characteristic of the beam of laser energy, the method further comprising:
measuring, using the beam analysis system, the second beam characteristic;
generating measurement data representative of the measured second beam characteristic;
transmitting the measurement data from the beam analysis system to a controller; and
outputting control commands from the controller to the at least one AOD based, at least in part, on the measurement data, wherein the at least one AOD is operative reduce the magnitude of the change in the second beam characteristic.
22 . The method of claim 8 , wherein the at least one AOD includes a pair of AODs.
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41 . The laser-processing apparatus of claim 1 , wherein:
the AOD is operative to change a first characteristic of the beam of laser energy, thereby changing a second characteristic of the beam of laser energy; and
the beam analysis system is operative to:
measure the second beam characteristic;
generate measurement data representative of the measured second beam characteristic;
transmit the measurement data from the beam analysis system to the controller; and
output control commands from the controller to the AOD based, at least in part, on the measurement data, wherein the AOD is operative reduce the magnitude of the change in the second beam characteristic.
42 . The laser-processing apparatus of claim 41 , wherein the AOD includes a pair of AODs.