Surface shape measuring apparatus and surface shape measuring method
A surface shape measuring apparatus for measuring a specular surface includes an illuminator configured to illuminate the specular surface with a first light pattern, an imaging device configured to capture an image of a second light pattern which is light transmitted through the illuminator after the first light pattern from the illuminator is reflected by the specular surface, and a processing apparatus configured to acquire a positional deviation amount of the second light pattern from a predetermined position in the image captured by the imaging device, and to output information related to a surface shape of the specular surface acquired from the positional deviation amount.
1 . A surface shape measuring apparatus for measuring a specular surface, comprising:
an illuminator having a flat plate shape and configured to illuminate the specular surface with a first light pattern;
an imaging device configured to capture an image of a second light pattern which is light transmitted through the illuminator after the first light pattern from the illuminator is reflected by the specular surface; and
a processing apparatus configured to acquire a positional deviation amount of the second light pattern from a predetermined position in the image captured by the imaging device, and to output information related to a surface shape of the specular surface acquired from the positional deviation amount,
wherein the illuminator includes:
one or more light sources, and
a light guide plate having a light incident surface, a first principal surface facing the specular surface, and a second principal surface facing the imaging device,
the light guide plate is configured to guide light emitted from the one or more light sources and incident thereto through the light incident surface, and
the first principal surface and the second principal surface are substantially parallel.
2 . A surface shape measuring apparatus a for measuring a specular surface, comprising:
an illuminator configured to illuminate the specular surface with a first light pattern;
an imaging device configured to capture an image of a second light pattern which is light transmitted through the illuminator after the first light pattern from the illuminator is reflected by the specular surface; and
a processing apparatus configured to acquire a positional deviation amount of the second light pattern from a predetermined position in the image captured by the imaging device, and to output information related to a surface shape of the specular surface acquired from the positional deviation amount,
wherein the illuminator includes:
one or more light sources;
a light guide plate having a light incident surface, a first principal surface, and a second principal surface, and configured to guide light emitted from the one or more light sources and incident thereto through the light incident surface; and
a light emitting part, disposed in one of an inside and a surface of the light guide plate, and configured to emit fluorescence in response to receiving light guided by the light guide plate, and
the illuminator emits the first light pattern formed to include the fluorescence emitted from the light emitting part.
3 . The surface shape measuring apparatus as claimed in claim 2 , wherein the illuminator includes a light blocking part disposed near the light emitting part disposed on the light guide plate on a side where the imaging device is located.
4 . The surface shape measuring apparatus as claimed in claim 3 , wherein:
each of the light emitting part and the light blocking part has a circular shape in a plan view, and
a diameter A of the light blocking part and a diameter B of the light emitting part satisfy a relationship 1.05×B<=A<=1.15×B, wherein <= represents less than or equal to.
5 . The surface shape measuring apparatus as claimed in claim 1 , wherein the pattern included in the first light pattern is a dot pattern.
6 . The surface shape measuring apparatus as claimed in claim 1 , further comprising:
a telecentric lens disposed between the illuminator and the imaging device,
wherein the imaging device captures the image of the second light pattern reflected by the specular surface, transmitted through the illuminator, and further transmitted through the telecentric lens.
7 . A surface shape measuring method for measuring a specular surface by a surface shape measuring apparatus having an illuminator, an imaging device, and a processing apparatus, the illuminator including one or more light sources, a light guide plate having a light incident surface, a first principal surface, and a second principal surface, and configured to guide light emitted from the one or more light sources and incident thereto through the light incident surface, and a light emitting part disposed in one of an inside and a surface of the light guide plate and configured to emit fluorescence in response to receiving light guided by the light guide plate, the surface shape measuring method comprising:
illuminating, by the illuminator, the specular surface with a first light pattern formed to include the fluorescence emitted from the light emitting part;
capturing, by the imaging device, an image of a second light pattern which is light transmitted through the illuminator after the first light pattern from the illuminator is reflected by the specular surface; and
acquiring, by the processing apparatus, a positional deviation amount of the second light pattern from a predetermined position in the image captured by the imaging device, and outputting information related to a surface shape of the specular surface acquired from the positional deviation amount.
8 . A surface shape measuring apparatus for measuring a specular surface, comprising:
an illuminator having a flat plate shape and configured to illuminate the specular surface with a first light pattern;
an imaging device configured to capture an image of a second light pattern which is light transmitted through the illuminator after the first light pattern from the illuminator is reflected by the specular surface; and
a processing apparatus configured to acquire a positional deviation amount of the second light pattern from a predetermined position in the image captured by the imaging device, and to output information related to a surface shape of the specular surface acquired from the positional deviation amount,
wherein a center of the illuminator and a center of the imaging device are arranged on a normal to the specular surface.
9 . The surface shape measuring apparatus as claimed in claim 8 , wherein the pattern included in the first light pattern is a dot pattern.
10 . The surface shape measuring apparatus as claimed in claim 8 , further comprising:
a telecentric lens disposed between the illuminator and the imaging device,
wherein the imaging device captures the image of the second light pattern reflected by the specular surface, transmitted through the illuminator, and further transmitted through the telecentric lens.