IP Library Patent Application 18759634
Patent Application
App. No. 18/759,634

LAMÉ MODE RESONATOR WITH ALUMINUM NITRIDE (AlN) MIRROR LAYER

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Quick Facts
Patent No.
US None
App. No.
18/759,634
Abstract

Aspects include devices and methods for a resonator with an aluminum nitride mirror layer. Some aspects may include an aluminum nitride layer formed on or above a substrate, an electrode layer formed on or above the aluminum nitride layer opposite the substrate, a piezoelectric layer formed on the electrode layer, and an interdigital transducer formed on the piezoelectric layer.

Claims (40)

1 . An electroacoustic structure comprising:

a substrate;

an aluminum nitride layer formed on or above the substrate;

an electrode layer formed on or above the aluminum nitride layer opposite the substrate;

a piezoelectric layer formed on the electrode layer; and

an interdigital transducer formed on the piezoelectric layer.

2 . The electroacoustic structure of claim 1 , wherein the piezoelectric layer comprises a crystalline structure selected to excite Lamé mode resonance.

3 . The electroacoustic structure of claim 2 , wherein the piezoelectric layer further comprises aluminum scandium-30 nitride (AlSc30N).

4 . The electroacoustic structure of claim 1 , wherein the electroacoustic structure has a resonance frequency between 3 gigahertz (GHz) and 8 GHz.

5 . The electroacoustic structure of claim 1 , wherein the aluminum nitride layer has a thickness approximately equal to a wavelength of a resonance frequency of the electroacoustic structure.

6 . The electroacoustic structure of claim 1 , wherein the interdigital transducer comprises a plurality of copper (Cu) electrode fingers.

7 . The electroacoustic structure of claim 1 , wherein the electrode layer comprises molybdenum (Mo).

8 . The electroacoustic structure of claim 1 , further comprising a silicon oxide (SiO2) layer formed on or above the aluminum nitride layer.

9 . The electroacoustic structure of claim 1 , wherein:

the electroacoustic structure is a resonator of a filter circuit within a wireless transceiver of a wireless communication device; and

the filter circuit is electrically coupled to an antenna of the wireless communication device.

10 . A method of fabricating an electroacoustic structure, the method comprising:

fabricating a silicon substrate;

forming an aluminum nitride layer on the silicon substrate; and

fabricating an electroacoustic stack on or above the aluminum nitride layer, the electroacoustic stack comprising a piezoelectric layer different from the aluminum nitride layer and a interdigital transducer, wherein the piezoelectric layer comprises a crystalline structure configured to excite a plate mode resonance.

11 . The method of claim 10 , wherein fabricating the electroacoustic stack comprises fabricating a lower interdigital transducer on the aluminum nitride layer;

forming the piezoelectric layer on or above the lower interdigital transducer; and

forming an upper interdigital transducer on the piezoelectric layer, where the interdigital transducer comprises the upper interdigital transducer and the lower interdigital transducer.

12 . The method of claim 10 , wherein fabricating the electroacoustic stack further comprises:

forming a silicon dioxide (SiO2) layer between the piezoelectric layer and the silicon substrate; and

forming an electrode layer between the SiO2 layer and the piezoelectric layer.

13 . The method of claim 12 , wherein the piezoelectric layer further comprises aluminum scandium-30 nitride (AlSc30N); and

wherein the electroacoustic structure has a resonance frequency between 3 gigahertz (GHz) and 8 GHz.

14 . The method of claim 13 , wherein the aluminum nitride layer is formed with a thickness approximately equal to a wavelength of the resonance frequency; and

wherein the electrode layer comprises molybdenum (Mo).

15 . An electroacoustic structure comprising:

a substrate;

an aluminum nitride layer formed on or above the substrate; and

an electroacoustic stack formed on or above the aluminum nitride layer, the electroacoustic stack comprising a piezoelectric layer different from the aluminum nitride layer and a interdigital transducer, the piezoelectric layer having a crystalline structure configured to excite a plate mode resonance.

16 . The electroacoustic structure of claim 15 , wherein the electroacoustic stack further comprises a silicon dioxide (SiO2) layer formed between the piezoelectric layer and the substrate.

17 . The electroacoustic structure of claim 16 , further comprising an electrode layer formed between the SiO2 layer and the piezoelectric layer.

18 . The electroacoustic structure of claim 17 , wherein the piezoelectric layer further comprises aluminum scandium-30 nitride (AlSc30N); and

wherein the electrode layer comprises molybdenum (Mo).

19 . The electroacoustic structure of claim 15 , wherein the interdigital transducer of the electroacoustic stack comprises a top interdigital transducer formed on or above the piezoelectric layer and a lower interdigital transducer formed under or below the piezoelectric layer.

20 . The electroacoustic structure of claim 19 , wherein a dielectric material is positioned between electrode fingers of the lower interdigital transducer.

Assignments (2)
CHANGE OF OWNER'S ADDRESS Recorded Aug 27, 2024
From: RF360 SINGAPORE PTE. LTD.
To: RF360 SINGAPORE PTE. LTD.
Reel/Frame 068788/0486 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 22, 2024
From: DURNER, RALPH
To: RF360 SINGAPORE PTE. LTD.
Reel/Frame 068042/0419 →