LAYER-BASED DEFECT DETECTION USING NORMALIZED SENSOR DATA
The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.
1 . A method of operating an additive manufacturing system, the method comprising:
generating an energy beam;
directing the energy beam across a work piece along a plurality of scan lines to fuse a layer of powder to the work piece;
using a processor to:
acquire data from an optical sensor arranged to receive optical emissions from the layer while the energy beam is directed across the work piece;
generate a first characteristic curve of a variation of optical emission intensity for a first group of the plurality of scan lines that are defined within a first region of the work piece;
generate a second characteristic curve of a variation of optical emission intensity for a second group of the plurality of scan lines that are defined within a second region of the work piece;
compare the first characteristic curve to a first baseline characteristic curve to detect a potential defect within the first region of the work piece; and
compare the second characteristic curve to a second baseline characteristic curve to detect a potential defect within the second region of the work piece.
2 . The method of claim 1 further comprising directing the energy beam to fuse a plurality of layers of powder to the work piece and wherein a unique first baseline characteristic curve is generated for each respective layer of the plurality of layers.
3 . The method of claim 1 further comprising directing the energy beam to fuse a plurality of layers of powder to the work piece and wherein a unique second baseline characteristic curve is generated for each respective layer of the plurality of layers.
4 . The method of claim 1 wherein the first baseline characteristic curve is a characteristic curve of a same first region of a same layer of a different work piece and the potential defect within the first region is identified by a deviation of the first characteristic curve from the first baseline characteristic curve.
5 . The method of claim 1 wherein the second baseline characteristic curve is a characteristic curve of a same second region of a same layer of a different work piece and the potential defect within the second region is identified by a deviation of the second characteristic curve from the second baseline characteristic curve.
6 . The method of claim 1 further comprising, correcting the optical emission intensity for a variation in a distance between the optical sensor and each respective scan line of the plurality of scan lines.
7 . The method of claim 1 wherein the acquired data comprises an intensity of the optical emissions from the layer for each scan line of the plurality of scan lines.
8 . The method of claim 1 further comprising, adjusting one or more parameters of the energy beam upon detecting a potential defect within the first region or the second region of the work piece.
9 . The method of claim 1 further comprising, directing the energy beam to fuse a plurality of layers of powder to the work piece and adjusting, upon detecting a potential defect within the first region or the second region in a layer of powder, one or more parameters of the energy beam in a successive layer of the plurality of layers.
10 . The method of claim 1 wherein the energy beam is a laser beam and the optical sensor shares optics with the laser beam.
11 . An additive manufacturing system comprising:
a powder bed adapted to hold a work piece;
an energy beam arranged to fuse a layer of powder to a work piece via a plurality of scan lines distributed across the work piece;
a sensor arranged to receive optical emissions from the layer of powder; and
a processor arranged to receive data from the sensor and adapted to:
generate a first characteristic curve of a variation of an intensity of the optical emissions for a first group of the plurality of scan lines that are defined within a first region of the work piece;
generate a second characteristic curve of a variation of optical emission intensity for a second group of the plurality of scan lines that are defined within a second region of the work piece;
compare the first characteristic curve to a first baseline characteristic curve to detect a potential defect within the first region of the work piece; and
compare the second characteristic curve to a second baseline characteristic curve to detect a potential defect within the second region of the work piece.
12 . The additive manufacturing system of claim 11 wherein the energy beam is arranged to fuse a plurality of layers of powder to the work piece and wherein a unique first baseline characteristic curve is generated for each respective layer of the plurality of layers.
13 . The additive manufacturing system of claim 11 wherein the energy beam is arranged to fuse a plurality of layers of powder to the work piece and wherein a unique second baseline characteristic curve is generated for each respective layer of the plurality of layers.
14 . The additive manufacturing system of claim 11 wherein the first baseline characteristic curve is a characteristic curve of a same first region of a same layer of a different work piece and the potential defect within the first region is identified by a deviation of the first characteristic curve from the first baseline characteristic curve.
15 . The additive manufacturing system of claim 11 wherein the second baseline characteristic curve is a characteristic curve of a same second region of a same layer of a different work piece and the potential defect within the second region is identified by a deviation of the second characteristic curve from the second baseline characteristic curve.
16 . The additive manufacturing system of claim 11 wherein the processor is further adapted to correct the optical emission intensity for a variation in a distance between the sensor and each respective scan line of the plurality of scan lines.
17 . The additive manufacturing system of claim 11 wherein the data received from the sensor comprises an intensity of the optical emissions from the layer for each scan line of the plurality of scan lines.
18 . The additive manufacturing system of claim 11 wherein the processor is further adapted to adjust one or more parameters of the energy beam upon detecting a potential defect within the first region or the second region of the work piece.
19 . The additive manufacturing system of claim 11 wherein the energy beam is arranged to fuse a plurality of layers of powder to the work piece and the processor is further adapted to adjust one or more parameters of the energy beam in a successive layer of the plurality of layers upon detecting a potential defect within the first region or the second region of a layer of powder.
20 . The additive manufacturing system of claim 11 wherein the energy beam is a laser beam and wherein the sensor shares optics with the laser beam.