DETECTOR RESPONSE CORRECTION METHOD AND APPARATUS FOR A PHOTON COUNTING X-RAY IMAGING SYSTEM

1 . A method for performing detector response correction in an X-ray imaging system having a photon-counting detector, the method comprising:

obtaining calibration data stored in a calibration data storage, where the calibration data is generated during a calibration procedure performed with the X-ray imaging system at a first time;

acquiring air scan data generated through an air scan performed with the X-ray imaging system at a second time, where the second time is after the first time;

performing, with the X-ray imaging system, an object scan on an imaging object at a third time to generate object scan data, where the third time is after the second time;

performing, using the generated object scan data, detector response correction based on the acquired air scan data and the obtained calibration data; and

reconstructing, based on the performed detector response correction, an image of the imaging object.

2 . The method of claim 1 , wherein the obtaining step further comprises obtaining calibration air scan data and a calibration table stored in the calibration data storage, wherein the calibration air scan data is generated through a calibration air scan performed during the calibration procedure,

the step of performing the detector response correction further comprises:

calculating, based on the obtained calibration air scan data and the acquired air scan data, an air scan correcting ratio in a pixel-by-pixel, energy-bin-by-energy-bin manner, for a plurality of pixels and a plurality of energy bins,

correcting the generated object scan data based on the calculated air scan correcting ratios, and

using the corrected object scan data to generate a line-integral sinogram, based on the obtained calibration table, and

the reconstructing step further comprises reconstructing the image of the imaging object, based on the generated line-integral sinogram.

3 . The method of claim 1 , wherein the obtaining step further comprises obtaining calibration air scan data and calibration slab scan data stored in the calibration data storage, wherein the calibration air scan data is generated through a calibration air scan performed during the calibration procedure, and the calibration slab scan data is generated through a calibration slab scan performed during the calibration procedure,

the step of performing the detector response correction further comprises:

calculating, based on the obtained calibration air scan data and the acquired air scan data, an air scan correcting ratio in a pixel-by-pixel, energy-bin-by-energy-bin manner, for a plurality of pixels and a plurality of energy bins,

correcting the obtained calibration slab scan data based on the calculated air scan correcting ratios,

generating a calibration table based on the obtained calibration air scan data and the corrected calibration slab scan data, and

using the generated object scan data to generate a line-integral sinogram, based on the generated calibration table, and

the reconstructing step further comprises reconstructing the image of the imaging object, based on the generated line-integral sinogram.

4 . The method of claim 1 , wherein the obtaining step further comprises obtaining calibration air scan data, calibration slab scan data, and a calibration table stored in the calibration data storage, wherein the calibration air scan data is generated through a calibration air scan performed during the calibration procedure, and the calibration slab scan data is generated through a calibration slab scan performed during the calibration procedure,

the step of the performing detector response correction further comprises:

calculating, based on the obtained calibration air scan data and the acquired air scan data, an air scan correcting ratio in a pixel-by-pixel, energy-bin-by-energy-bin manner, for a plurality of pixels and a plurality of energy bins,

calculating, for each specific air scan correcting ratio of the calculated air scan correcting ratios, a corresponding attenuation scan correcting ratio, based on the specific air scan correcting ratio, the obtained calibration air scan data, and the obtained calibration slab scan data,

correcting the generated object scan data based on the calculated attenuation scan correcting ratios, and

using the corrected object scan data to generate a line-integral sinogram, based on the obtained calibration table, and

the reconstructing step further comprises reconstructing the image of the imaging object, based on the generated line-integral sinogram.

5 . The method of claim 4 , wherein the step of calculating the corresponding attenuation scan correcting ratio further comprises:

for each specific air scan correcting ratio of the calculated air scan correcting ratios, calculating an energy bin threshold drift for an energy bin corresponding to the specific air scan correcting ratio, based on a linear interpolation or a higher order polynomial function of the obtained calibration air scan data associated with the energy bin and an adjacent energy bin, and

calculating, based on the calculated energy bin threshold drift and the obtained calibration slab scan data, the corresponding attenuation scan correcting ratio.

6 . The method of claim 4 , wherein the obtaining step further comprises:

selecting, among respective calibration slab scan data generated through a plurality of calibration slab scans performed on a plurality of slabs that have different attenuation pathlengths, calibration slab scan data generated through a calibration slab scan performed on a specific slab that has an attenuation pathlength closest to an attenuation pathlength of the imaging object, as the obtained calibration slab scan data.

7 . The method of claim 4 , wherein during the calibration air scan, a tube current is applied such that a difference between a detector counting rate caused during the calibration air scan and a detector counting rate of the calibration slab scan is less than or equal to a predefined threshold, and

the acquiring step further comprises setting a tube current applied during the air scan, such that a difference between a detector counting rate caused during the air scan and the detector counting rate of the calibration slab scan is less than or equal to the predefined threshold.

8 . The method of claim 4 , wherein the obtain step further comprises:

selecting, among respective calibration slab scan data generated through a plurality of calibration slab scans performed on a slab with a plurality of different tube currents applied, calibration slab scan data generated through a calibration slab scan with a specific tube current that is closest to a tube current applied in the object scan, as the obtained calibration slab scan data.

9 . The method of claim 1 , wherein the obtaining step further comprises obtaining calibration air scan data and calibration slab scan data stored in the calibration data storage, wherein the calibration air scan data is generated through a calibration air scan performed during the calibration procedure, and the calibration slab scan data is generated through a calibration slab scan performed during the calibration procedure,

the step of performing the detector response correction further comprises:

calculating, based on the obtained calibration air scan data and the acquired air scan data, an air scan correcting ratio in a pixel-by-pixel, energy-bin-by-energy-bin manner, for a plurality of pixels and a plurality of energy bins,

calculating, for each specific air scan correcting ratio of the calculated air scan correcting ratios, a corresponding attenuation scan correcting ratio, based on the specific air scan correcting ratio, the obtained calibration air scan data, and the obtained calibration slab scan data,

correcting the obtained calibration slab scan data based on the calculated air scan correcting ratios,

generating a calibration table based on the obtained calibration air scan data and the corrected calibration slab scan data, and

using the generated object scan data to generate a line-integral sinogram, based on the generated calibration table, and

the reconstructing step further comprises reconstructing the image of the imaging object, based on the generated line-integral sinogram.

10 . The method of claim 1 , wherein the acquiring step further comprises acquiring the air scan data generated through the air scan that is performed upon a predefined criterion being met, and

the predefined criterion is met when a predefined time period has elapsed since the calibration procedure, when a difference between a condition under which the X-ray imaging system operates and the condition under which the calibration procedure is performed is larger than or equal to a predetermined threshold, and/or when a scan protocol to be applied with the X-ray imaging system is different from a scan protocol that is applied when the calibration procedure is performed.

11 . An apparatus for performing detector response correction in an X-ray imaging system having a photon-counting detector, the apparatus comprising:

processing circuitry configured to

obtain calibration data stored in a calibration data storage, where the calibration data is generated during a calibration procedure performed with the X-ray imaging system at a first time,

acquire air scan data generated through an air scan performed with the X-ray imaging system at a second time, where the second time is after the first time,

perform, with the X-ray imaging system, an object scan on an imaging object at a third time to generate object scan data, where the third time is after the second time,

perform, using the generated object scan data, detector response correction based on the acquired air scan data and the obtained calibration data, and

reconstruct, based on the performed detector response correction, an image of the imaging object.

12 . The apparatus of claim 11 , wherein the processing circuitry is further configured to:

obtain calibration air scan data and a calibration table stored in the calibration data storage, wherein the calibration air scan data is generated through a calibration air scan performed during the calibration procedure,

calculate, based on the obtained calibration air scan data and the acquired air scan data, an air scan correcting ratio in a pixel-by-pixel, energy-bin-by-energy-bin manner, for a plurality of pixels and a plurality of energy bins,

correct the generated object scan data based on the calculated air scan correcting ratios,

use the corrected object scan data to generate a line-integral sinogram, based on the obtained calibration table, and

reconstruct the image of the imaging object, based on the generated line-integral sinogram.

13 . The apparatus of claim 11 , wherein the processing circuitry is further configured to:

obtain calibration air scan data and calibration slab scan data stored in the calibration data storage, wherein the calibration air scan data is generated through a calibration air scan performed during the calibration procedure, and the calibration slab scan data is generated through a calibration slab scan performed during the calibration procedure,

calculate, based on the obtained calibration air scan data and the acquired air scan data, an air scan correcting ratio in a pixel-by-pixel, energy-bin-by-energy-bin manner, for a plurality of pixels and a plurality of energy bins,

correct the obtained calibration slab scan data based on the calculated air scan correcting ratios,

generate a calibration table based on the obtained calibration air scan data and the corrected calibration slab scan data,

use the generated object scan data to generate a line-integral sinogram, based on the generated calibration table, and

reconstruct the image of the imaging object, based on the generated line-integral sinogram.

14 . The apparatus of claim 11 , wherein the processing circuitry is further configured to:

obtain calibration air scan data, calibration slab scan data, and a calibration table stored in the calibration data storage, wherein the calibration air scan data is generated through a calibration air scan performed during the calibration procedure, and the calibration slab scan data is generated through a calibration slab scan performed during the calibration procedure,

calculate, based on the obtained calibration air scan data and the acquired air scan data, an air scan correcting ratio in a pixel-by-pixel, energy-bin-by-energy-bin manner, for a plurality of pixels and a plurality of energy bins,

calculate, for each specific air scan correcting ratio of the calculated air scan correcting ratios, a corresponding attenuation scan correcting ratio, based on the specific air scan correcting ratio, the obtained calibration air scan data, and the obtained calibration slab scan data,

correct the generated object scan data based on the calculated attenuation scan correcting ratios,

use the corrected object scan data to generate a line-integral sinogram, based on the obtained calibration table, and

reconstruct the image of the imaging object, based on the generated line-integral sinogram.

15 . The apparatus of claim 14 , wherein the processing circuitry is further configured to:

for each specific air scan correcting ratio of the calculated air scan correcting ratios, calculate an energy bin threshold drift for an energy bin corresponding to the specific air scan correcting ratio, based on a linear interpolation or a higher order polynomial function of the obtained calibration air scan data associated with the energy bin and an adjacent energy bin, and

calculate, based on the calculated energy bin threshold drift and the obtained calibration slab scan data, the corresponding attenuation scan correcting ratio.

16 . The apparatus of claim 14 , wherein the processing circuitry is further configured to:

select, among respective calibration slab scan data generated through a plurality of calibration slab scans performed on a plurality of slabs that have different attenuation pathlengths, calibration slab scan data generated through a calibration slab scan performed on a specific slab that has an attenuation pathlength closest to an attenuation pathlength of the imaging object, as the obtained calibration slab scan data.

17 . The apparatus of claim 14 , wherein during the calibration air scan, a tube current is applied such that a difference between a detector counting rate caused during the calibration air scan and a detector counting rate of the calibration slab scan is less than or equal to a predefined threshold, and

the processing circuitry is further configured to set a tube current applied during the air scan, such that a difference between a detector counting rate caused during the air scan and the detector counting rate of the calibration slab scan is less than or equal to the predefined threshold.

18 . The apparatus of claim 14 , wherein the processing circuitry is further configured to:

select, among respective calibration slab scan data generated through a plurality of calibration slab scans performed on a slab with a plurality of different tube currents applied, calibration slab scan data generated through a calibration slab scan with a specific tube current that is closest to a tube current applied in the object scan, as the obtained calibration slab scan data.

19 . The apparatus of claim 11 , wherein the processing circuitry is further configured to:

obtain calibration air scan data and calibration slab scan data stored in the calibration data storage, wherein the calibration air scan data is generated through a calibration air scan performed during the calibration procedure, and the calibration slab scan data is generated through a calibration slab scan performed during the calibration procedure,

calculate, based on the obtained calibration air scan data and the acquired air scan data, an air scan correcting ratio in a pixel-by-pixel, energy-bin-by-energy-bin manner, for a plurality of pixels and a plurality of energy bins,

calculate, for each specific air scan correcting ratio of the calculated air scan correcting ratios, a corresponding attenuation scan correcting ratio, based on the specific air scan correcting ratio, the obtained calibration air scan data, and the obtained calibration slab scan data,

correct the obtained calibration slab scan data based on the calculated air scan correcting ratios,

generate a calibration table based on the obtained calibration air scan data and the corrected calibration slab scan data,

use the generated object scan data to generate a line-integral sinogram, based on the generated calibration table, and

reconstruct the image of the imaging object, based on the generated line-integral sinogram.

20 . A non-transitory computer readable medium having instructions stored therein that, when executed by one or more processors, cause the one or more processors to perform a method for performing detector response correction in an X-ray imaging system having a photon-counting detector, the method comprising:

obtaining calibration data stored in a calibration data storage, where the calibration data is generated during a calibration procedure performed with the X-ray imaging system at a first time;

acquiring air scan data generated through an air scan performed with the X-ray imaging system at a second time, where the second time is after the first time;

performing, with the X-ray imaging system, an object scan on an imaging object at a third time to generate object scan data, where the third time is after the second time;

performing, using the generated object scan data, detector response correction based on the acquired air scan data and the obtained calibration data; and

reconstructing, based on the performed detector response correction, an image of the imaging object.