Method and System for Detecting a Material
A method of detecting a material, and corresponding system, include irradiating a target during an irradiation period with source x-rays; detecting imaging x-rays and x-ray fluorescence received from the target resulting from the irradiating during the irradiation period; and providing an indication of the material being potentially present in the target, the indication based on both analyzing an x-ray image generated from the detected imaging x-rays and on analyzing the detected x-ray fluorescence for characteristic x-ray fluorescence that can be emitted from the material.
1 . A method of detecting a material, the method comprising:
irradiating a target during an irradiation period with source x-rays;
detecting imaging x-rays and x-ray fluorescence received from the target resulting from the irradiating during the irradiation period; and
providing an indication of the material being potentially present in the target, the indication based on both analyzing an x-ray image generated from the detected imaging x-rays and on analyzing the detected x-ray fluorescence for characteristic x-ray fluorescence that can be emitted from the material.
2 . The method of claim 1 , wherein the material includes a high-Z material.
3 . The method of claim 2 , wherein the material includes lead.
4 . The method of claim 1 , wherein the material includes tungsten, another metal, a heavy metal, a heavy metal shielding, a nuclear material, ammunition, a weapon, a plastic explosive, a liquid explosive, a gun, and/or a knife.
5 . The method of claim 1 , wherein the source x-rays have an end-point energy of at least 88 keV.
6 . The method of claim 1 , further including enabling motion of the target with respect to a stationary x-ray source.
7 . The method of claim 6 , wherein enabling motion of the target includes causing translational motion of the target with respect to the stationary x-ray source.
8 . The method of claim 6 , wherein enabling the motion includes causing rotational motion of the target with respect to the stationary x-ray source.
9 . The method of claim 6 , wherein enabling motion of the target with respect to the stationary x-ray source includes enabling a vehicle to pass through a vehicle portal by the vehicle's own power.
10 . The method of claim 1 , wherein the irradiating is with the source x-rays formed into a fan beam, or further comprising forming the source x-rays into a scanning pencil beam.
11 . The method of claim 1 , wherein detecting the imaging x-rays includes detecting x-rays selected from a group consisting of scattered x-rays that are scattered from the target, transmitted x-rays that are transmitted through the target, and combinations thereof.
12 . The method of claim 1 , wherein the indication is an indication of probability.
13 . The method of claim 12 , wherein the indication of the probability is limited to binary YES or NO indication options, or wherein the indication of the probability is limited to a finite number of percentage brackets.
14 . The method of claim 1 , wherein providing the indication includes analyzing the x-ray image by a processor.
15 . The method of claim 1 , wherein detecting the imaging x-rays includes using a detector formed at least partly of cadmium telluride, cadmium zinc telluride, cesium lead bromide, or a combination thereof.
16 . A system for detecting a material, the system comprising:
an x-ray source configured to irradiate a target with source x-rays during an irradiation period;
a set of detectors configured to detect imaging x-rays and x-ray fluorescence received from the target resulting from the irradiation during the irradiation period; and
an analyzer configured to provide an indication of the material being potentially present in the target, the indication based on both analyzing an x-ray image generated from the detected imaging x-rays and on analyzing the detected x-ray fluorescence for characteristic x-ray fluorescence that can be emitted from the material.
17 . The system of claim 16 , wherein the material includes a high-Z material.
18 . The system of claim 17 , wherein the high-Z material includes lead.
19 . The system of claim 16 , wherein the material includes an item selected from the group consisting of tungsten, another metal, a heavy metal, a heavy metal shielding, a nuclear material, ammunition, a weapon, a plastic explosive, a liquid explosive, a gun, a knife, and combinations thereof.
20 . A system for detecting a material, the method comprising:
means for irradiating a target during an irradiation period with source x-rays;
means for detecting imaging x-rays and x-ray fluorescence received from the target resulting from the irradiating during the irradiation period; and
means for providing an indication of the material being potentially present in the target, the indication based on both analyzing an x-ray image generated from the detected imaging x-rays and on analyzing the detected x-ray fluorescence for characteristic x-ray fluorescence that can be emitted from the material.