Additive Manufacturing with Photo-Acoustic Tomography Defect Testing
An additive manufacturing method supporting layer by layer testing includes a layer test including generating a hammer beam using laser light having a first wavelength, generating a read-out beam using laser light having a second wavelength, directing the generated hammer beam toward a first layer on a part to provide an acoustic hammer pulse that induces surface movement of the part, and reading the surface movement of the part using the read-out beam directed to a second position on the part. Layers can be added and the layer test repeated.
1 . An additive manufacturing method comprising:
adding a layer that defines at least a portion of a part using an additive writing system;
directing laser beams toward the part to be read-out beams that travels back upon reaching the part;
imposing spatial phase onto a reference beam;
generating an image interferogram based on the reference and the read-out beams; and
using an areal camera arranged to capture information that includes the image interferogram,
wherein adding the layer comprises applying a correction that is determined based on the captured information.
2 . The method of claim 1 , wherein the image interferogram is generated by coherent mixing between the reference beam and the read-out beams.
3 . The method of claim 1 , wherein the information captured by the areal camera comprises a distance measurement associated with the image interferogram.
4 . The method of claim 1 , wherein the read-out beams that travels back is encoded with phase information from the part being manufactured.
5 . The method of claim 1 , wherein the spatial phase is imposed on the reference beam by a reflective phase light valve.
6 . The method of claim 1 , wherein the image interferogram is generated by using a Michelson interferometer.
7 . The method of claim 1 , wherein the areal camera is a fast frame rate camera.
8 . The method of claim 1 , wherein determining the correction comprises detecting phase variation change based on the image interferogram with reference to a temporally static reference image as a voltage change on a per pixel basis.