INSPECTION DEVICE
An inspection device includes a carrier, an input electrode, a metal layer and a contact electrode. The input electrode is disposed on the carrier. The metal layer includes a fixed portion and an extending portion. The fixed portion is disposed on the carrier, the fixed portion has one end connected to the input electrode, and has another end that extends in a direction far away from the carrier. The extending portion is electrically connected to the another end of the fixed portion, the extending portion is separated from the carrier by a spacing to form a buffer region. The contact electrode is disposed on the extending portion of the metal layer, and electrically connected to the extending portion of the metal layer. The contact electrode has a concave surface facing away from the carrier.
1 . An inspection device, comprising:
a carrier;
an input electrode, disposed on the carrier;
a metal layer, comprising:
a fixed portion, disposed on the carrier, and having a first end and a second end, the first end being electrically connected to the input electrode, the second end extending in a direction far away from the carrier; and
an extending portion, electrically connected to the second end, and separated from the carrier by a spacing to form a buffer region; and
a contact electrode, having a concave surface facing away from the carrier, and disposed on and electrically connected to the extending portion.
2 . The inspection device of claim 1 , further comprising an insulating layer covering the metal layer, wherein the contact electrode abuts against the insulating layer.
3 . The inspection device of claim 2 , wherein the insulating layer fills the buffer region.
4 . The inspection device of claim 2 , wherein the carrier and the insulating layer are capable of being passed through by a visible light.
5 . The inspection device of claim 2 , wherein, the extending portion has a first side facing away from the carrier, and a second side facing the carrier, the insulating layer comprises a first insulating layer covering the firs side, and a second insulating layer covering the second side and having a Young's modulus greater than that of the first insulating layer.
6 . The inspection device of claim 5 , wherein the Young's modulus of the first insulating layer is less than or equal to 10 GPa.
7 . The inspection device of claim 5 , wherein the insulating layer further comprises a third insulating layer connected to the second insulating layer and the carrier, and the Young's modulus of the second insulating layer is greater than that of the third insulating layer.
8 . The inspection device of claim 7 , wherein the third insulating layer comprises a plurality of hollow portions.
9 . The inspection device of claim 8 , wherein at least one of the plurality of hollow portions has a height in a direction perpendicular to the carrier, and the height is less than the spacing.
10 . The inspection device of claim 2 , wherein the insulating layer has a recessed region for accommodating the contact electrode.
11 . The inspection device of claim 10 , wherein the contact electrode has an exposed portion not located within the recessed region.
12 . The inspection device of claim 11 , wherein the exposed portion is disposed at a periphery of the concave surface.
13 . The inspection device of claim 2 , further comprising a conductive path disposed within the insulating layer, and electrically connected to the contact electrode and the extending portion.
14 . The inspection device of claim 1 , wherein the contact electrode has a convex portion protruding from the concave surface.
15 . The inspection device of claim 1 , further comprising a conductive path connected to the contact electrode and the extending portion.