IP Library › Granted Patent US 575,174
Granted Patent S1
US 575,174 · App. 29/289,116 · Granted Aug 19, 2008

Apparatus for measuring electrical parameters

Assignee: Liaisons Electroniques-Mecaniques Lem SA
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Quick Facts
Patent No.
US 575,174
App. No.
29/289,116
Granted
Aug 19, 2008
Kind
S1
Claims (1)

The ornamental design for a apparatus for measuring electrical parameters, as shown and described.

Assignments (3)
CHANGE OF NAME Recorded Feb 19, 2020
From: LIAISONS ELECTRONIQUES-MÉCANIQUES LEM SA
To: LEM INTELLECTUAL PROPERTY SA
Reel/Frame 052567/0668 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 19, 2020
From: LEM INTELLECTUAL PROPERTY SA
To: LEM INTERNATIONAL SA
Reel/Frame 051971/0458 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 6, 2007
From: MOREL, PASCAL
To: LIAISONS ELECTRONIQUES-MECANIQUES LEM SA
Reel/Frame 019592/0052 →
Priority Claims (1)
CH 133588 · Jan 19, 2007 · national