IP Library › Granted Patent US 753,002
Granted Patent S1
US 753,002 · App. 29/514,629 · Granted Apr 5, 2016

Diagnostic circuit test device

Inventor: Wayne Russell (Ontario, CA)
Assignee: Power Probe TEK, LLC
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Quick Facts
Patent No.
US 753,002
App. No.
29/514,629
Granted
Apr 5, 2016
Kind
S1
Claims (1)

The ornamental design for an diagnostic circuit test device, as shown and described.

Assignments (3)
MERGER Recorded Jul 29, 2025
From: POWER PROBE TEK, LLC
To: POWER PROBE GROUP, INC.
Reel/Frame 071868/0423 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 18, 2016
From: RUSSELL, WAYNE
To: POWER PROBE TEK, LLC
Reel/Frame 037769/0396 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 4, 2016
From: POWER PROBE, INC.
To: POWER PROBE TEK, LLC
Reel/Frame 037402/0807 →