IP Library › Granted Patent US 735,878
Granted Patent S1
US 735,878 · App. 29/518,489 · Granted Aug 4, 2015

Specimen analysis apparatus

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Quick Facts
Patent No.
US 735,878
App. No.
29/518,489
Granted
Aug 4, 2015
Kind
S1
Claims (1)

The ornamental design for a specimen analysis apparatus, as shown and described.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 23, 2016
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEDICAL SYSTEMS CORPORATION
Reel/Frame 039121/0081 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 25, 2015
From: CHANG, SHIANWEI
To: KABUSHIKI KAISHA TOSHIBA; TOSHIBA MEDICAL SYSTEMS CORPORATION
Reel/Frame 035023/0013 →