IP Library › Patent Application 60270415
Patent Application Provisional
App. No. 60/270,415 · Confirmation No. 7634

Atomic force Microscope attached scatterometer for nano-topography mapping

Inventors: Joseph Leigh, David Kuo
Provisional Application Expired
⬇ PDF
 Code Description Pages PDF
2001-02-20 TRNA Transmittal of New Application 2 View
2001-02-20 SPEC Specification 3 View
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this application's details
Quick Facts
App. No.
60/270,415
Filed
2001-02-20