IP Library › Patent Application 60291860
Patent Application Provisional
App. No. 60/291,860 · Confirmation No. 3742

Determination of dielectric constants of extremely thin dielectric materials in a MOS (metal oxide semiconductor) stack

Provisional Application Expired
⬇ PDF
 Code Description Pages PDF
2001-05-18 TRNA Transmittal of New Application 2 View
2001-05-18 SPEC Specification 5 View
2001-05-18 DRW Drawings-only black and white line drawings 1 View
2001-05-18 LET. Miscellaneous Incoming Letter 2 View
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Quick Facts
App. No.
60/291,860
Filed
2001-05-18