Method and apparatus for measuring, analyzing, and characterizing irregularities on a surface of an article

Inventors: Mark Shuster, Donald K. Cohen, Dana M. Combs, Ralph W. Larson, Robert R. Binoniemi

Provisional Application Expired

	Code	Description	Pages	PDF
2001-07-28	`TRNA`	Transmittal of New Application	1	View
2001-07-28	`SPEC`	Specification	21	View
2001-07-28	`CLM`	Claims	1	View
2001-07-28	`DRW`	Drawings-only black and white line drawings	102	View
2001-07-28	`LET.`	Miscellaneous Incoming Letter	1	View

Inventors

Mark Shuster Toledo, OH

Donald K. Cohen Farmington Hills, MI

Dana M. Combs Toledo, OH

Ralph W. Larson Olivet, MI

Robert R. Binoniemi Sturgis, MI

Attorneys & Agents of Record

RICHARD MACMILLAN Reg. 30085 Attorney · MACMILLAN SOBANSKI AND TODD LLC

DOUGLAS PAVELKO Reg. 36888 Attorney · MACMILLAN, SOBANSKI & TODD, LLC

Prosecution

MICHIGAN METROLOGY, LLC

from COHEN, DONALD K.

ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded 2003-05-15

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