Patent Application
Provisional
App. No. 60/335,820
· Confirmation No. 1139
System and method for inspection using white light interferometry
Provisional Application Expired
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-12-05 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-12-05 | SPEC |
Specification | 16 | View | |
| 2001-12-05 | CLM |
Claims | 8 | View | |
| 2001-12-05 | ABST |
Abstract | 1 | View | |
| 2001-12-05 | DRW |
Drawings-only black and white line drawings | 8 | View | |
| 2001-12-05 | LET. |
Miscellaneous Incoming Letter | 1 | View |
Inventors
Sanjeev Mathur
Irving, TX
Chu-Yin Chang
Plano, TX
Attorneys & Agents of Record
Prosecution
- Customer No.
- 909
- Docket No.
- 013377.0088 (B73228)
- Confirmation No.
- 1139
No recorded assignments were found for this patent.
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Quick Facts
- App. No.
- 60/335,820
- Filed
- 2001-12-05
External Links