Patent Application
Provisional
App. No. 60/338,107
· Confirmation No. 2377
Slurry composition for chemical mechanical planarization (CMP) of low dielectric constant (Low-K) inter-layer dielectric (ILD) and inter-metal dielectric (IMD) materials and for silicon dioxide (SiO2) and silicon carbide (SiC) hard mask capping layers
Provisional Application Expired