IP Library Patent Application 60348871
Patent Application Provisional
App. No. 60/348,871 · Confirmation No. 5801

Integrated, multi-step computer-implemented system and method for measuring and improving manufacturing processes and maximizing product research and development speed and efficiency using high-throughput screening and governing semi-empirical model

Provisional Application Expired
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Code Description Pages PDF
2002-01-15 TRNA Transmittal of New Application 2 View
2002-01-15 SPEC Specification 31 View
2002-01-15 CLM Claims 2 View
2002-01-15 ABST Abstract 1 View
2002-01-15 DRW Drawings-only black and white line drawings 3 View
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Quick Facts
App. No.
60/348,871
Filed
2002-01-15