IP Library Patent Application 60356074
Patent Application Provisional
App. No. 60/356,074 · Confirmation No. 4557

Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements

Provisional Application Expired
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Code Description Pages PDF
2002-02-11 TRNA Transmittal of New Application 2 View
2002-02-11 SPEC Specification 6 View
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Quick Facts
App. No.
60/356,074
Filed
2002-02-11