Reduced-pin-count-testing architectures for applying at-speed patterns

Inventors: Nilanjan Mukherjee, Wu-Tung Cheng, Jay Jahangiri, Ronald Press

Provisional Application Expired

	Code	Description	Pages	PDF
2005-06-15	`TRNA`	Transmittal of New Application	2	View
2005-06-15	`SPEC`	Specification	13	View
2005-06-15	`DRW`	Drawings-only black and white line drawings	9	View
2005-06-15	`WFEE`	Fee Worksheet (SB06)	1	View

Inventors

Nilanjan Mukherjee Wilsonville, OR

Wu-Tung Cheng Lake Oswego, OR

Jay Jahangiri Portland, OR

Ronald Press Tualatin, OR

Attorneys & Agents of Record

PATRICK BIBLE Reg. 44423 Attorney · KLARQUIST SPARKMAN, LLP

DANIEL STAUDT Reg. 34733 Attorney · SIEMENS CORPORATION

ROBERT SCOTTI Reg. 39830 Attorney · KLARQUIST SPARKMAN, LLP

FRANK NUZZI Reg. 42944 Attorney · SIEMENS CORPORATION

JEFFREY RICHMOND Reg. 57564 Attorney · MENTOR GRAPHICS CORPORATION

RAJEEV ROHATGI Reg. 62297 Agent · KLARQUIST SPARKMAN LLP

XIN YANG Reg. 62400 Attorney · SIEMENS CORPORATION

MARK WILSON Reg. 63126 Attorney · KLARQUIST SPARKMAN, LLP

JOHN LUNSFORD Reg. 67185 Attorney · F5 NETWORKS

LAWRENCE CHEN Reg. 67768 Attorney · SIEMENS

CARSTEN GRELLMANN Reg. 69774 Attorney · KLARQUIST SPARKMAN LLP

Prosecution

MENTOR GRAPHICS CORPORATION

from CHENG, WU-TUNG, JAHANGIRI, JAY, MUKHERJEE, NILANJAN, PRESS, RONALD

ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded 2006-09-25

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