Patent Application
Provisional
Small
App. No. 60/694,049
· Confirmation No. 5931
Wafer-scale test probe card using nano-tube vertically-compressible contact structures for the purpose of wafer-level-burn-in and wafer-level test
Provisional Application Expired
Inventors
Douglas E. Crafts
Los Gatos, CA
Jyoti Kiron Bhardwaj
Cupertino, CA
Attorneys & Agents of Record
Prosecution
- Docket No.
- 104.1002
- Confirmation No.
- 5931
Child
Claims priority from a provisional application
→
App. 12/211,354
· US 7,710,106
Filed 2008-09-16
· Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Child
Claims priority from a provisional application
→
App. 11/426,249
· US 7,439,731
Filed 2006-06-23
· Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Child
Claims priority from a provisional application
→
App. 12/773,117
· US 8,638,113
Filed 2010-05-04
· Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Child
PCT
Claims priority from a provisional application
→
PCT/US2006/024318
Filed 2006-06-23
· RO PROCESSING COMPLETED-PLACED IN STORAGE
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2010-10-11
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Quick Facts
- App. No.
- 60/694,049
- Filed
- 2005-06-24
External Links