Patent Application
Provisional
App. No. 63/200,837
· Confirmation No. 4758
ON CHIP MEASUREMENT OF HIGH VOLTAGE NODE WITH LOW VOLTAGE MEASUREMENT CIRCUIT AND RELATED SYSTEMS, METHODS AND DEVICES
Inventor:
Lei Zou
Applicant:
Microchip Technology Incorporated
Provisional Application Expired
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2021-04-06 | APP.FILE.REC |
Filing Receipt | 3 | View | |
| 2021-03-31 | N417.PYMT |
Electronic Fee Payment | — | View | |
| 2021-03-31 | N417 |
Electronic Filing System Acknowledgment Receipt | — | View | |
| 2021-03-31 | DRW |
Drawings-only black and white line drawings | — | View | |
| 2021-03-31 | ADS |
Application Data Sheet | — | View | |
| 2021-03-31 | SPEC |
Specification | — | View | |
| 2021-03-31 | CLM |
Claims | — | View | |
| 2021-03-31 | SPEC |
Specification | — | View |
Inventors
Lei Zou
Langhus, NORWAY
Attorneys & Agents of Record
Prosecution
- Customer No.
- 145922
- Docket No.
- 3780-P16122US
- Confirmation No.
- 4758
No recorded assignments were found for this patent.
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Quick Facts
- App. No.
- 63/200,837
- Filed
- 2021-03-31
External Links