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Patent Application Re-Examination
App. No. 95/001,495 · Confirmation No. 5516

High Density Semiconductor Memory Cell and Memory Array Using a Single Transistor and Having Variable Gate Oxide Breakdown

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Quick Facts
App. No.
95/001,495
Filed
2010-12-07
Effective Filing
2010-11-24
Examiner
GE, YUZHEN
Art Unit
3992