Method and system for mass analysis of samples
View Patent ↗A system and method of analyzing a sample is described. The system includes an ion source and a deflector for producing a plurality of ion beams each of which is detected in distinct detection regions. A detection system uses the information obtained from the detection region to analyze the sample.
1. A method of analyzing a sample, the method comprising:
producing a source beam of analyte ions from the sample; by the steps of deflecting and pulsing, generating from the source beam a plurality of offset beams, each offset beam comprised of packets of analyte ions over at least a portion of their extent thereof, the step of pulsing to generate the packets of analyte ions from either the source beam or from each of the plurality of offset beams, the packets of analyte ions generated at a select frequency so that for each of the offset beams the ions from one of the packets of analyte ions do not overlap with the ions from adjacent packets of analyte ions in the same offset beam; wherein the steps of deflecting and pulsing generates the plurality of offset beams of packets of analyte ions so that each beam is distinct from each other and the beams of packets of analyte ions are offset from each other in both time and space; detecting the packets of analyte ions of each of the offset beams in a detection region; and
performing a mass analysis of the sample based on the detected packets of analyte ions.
2. The method of claim 1 , wherein the frequency of the pulsed packets of analyte ions in each of the offset beams is the same for each offset beam.
3. The method of claim 1 , wherein the packets of analyte ions of each of the offset beams is detected by a respective detection region.
4. The method of claim 3 , wherein the step of deflecting deflects the source beam with an electric field so that the offset beams propagate along different paths.
5. The method of claims 1 , 2 , 3 or 4 , wherein the source beam is pulsed to generate the packets of analyte ions before the source beam is deflected.
6. The method of claims 1 , 2 , 3 or 4 , wherein the offset beams are pulsed to generate the packets of analyte ions after the source beam is deflected.
7. The method of claim 5 , wherein the source beam is pulsed to generate packets of analyte ions at an initial frequency, and the source beam is deflected to generate the offset beams having respective packets of analyte ions, and the combined frequencies of the packets of analyte ions from the offset beams is not greater than the initial frequency.
8. The method of claim 1 , wherein the mass analysis is performed by a time-of-flight analyzer.
9. The method of claim 1 , the mass analysis is performed by a time-of-flight analyzer having orthogonal injection of ions.
10. A system for analyzing a sample, the system comprising:
an ion source derived from the sample for producing a source beam of analyte ions; a deflector to deflect the source beam with an electric field to produce a plurality of offset beams to propagate along different paths; a pulse generator to generate packets of analyte ions from either the source beam or from each of the offset beams, the pulse generator to generate the packets of analyte ions at a select frequency so that for each of the offset beams the ions from one of the packets of analyte ions do not overlap with the ions from adjacent packets of analyte ions in the same offset beam; wherein the deflector and pulse generator generate the plurality of offset beams of packets of analyte ions so that each beam is distinct from each other and the beams of packets of analyte ions are offset from each other in both time and space; a detection region to detect packets of analyte ions of each of the offset beams; and an analyzer to perform a mass analysis of the sample based on the detected packets of analyte ions.
11. The system of claim 10 , wherein the pulse generator pulses the packets of analyte ions so that the frequency of the pulsed packets of analyte ions in each of the offset beams is the same for each offset beam.
12. The system of claim 10 , wherein the detector region comprises a plurality of detectors, and each detector to detect packets of analyte ions of a corresponding offset beam.
13. The system of claim 12 , wherein the deflector deflects the source beam with an electric field so that the offset beams propagate along different paths.
14. The system of claims 10 , 11 , 12 , or 13 , wherein the pulse generator pulses the source beam to generate the packets of analyte ions before the source beam is deflected.
15. The system of claims 10 , 11 , 12 , or 13 , wherein the pulse generator pulses the offset beams to generate the packets of analyte ions after the source beam is deflected.
16. The system of claim 14 , wherein the pulse generator pulses the source beam to generate packets of analyte ions at an initial frequency, and the deflector deflects the source beam to generate the offset beams having respective packets of analyte ions, and the combined frequencies of the packets of analyte ions from the offset beams is not greater than the initial frequency.
17. The system of claim 10 , wherein the analyzer is a time-of-flight analyzer.
18. The system of claim 10 , wherein the analyzer is a time-of-flight analyzer with orthogonal injection of ions.