Multi-angle rotation for ion implantation of trenches in superjunction devices
View Patent ↗A method of manufacturing a semiconductor device includes providing a semiconductor wafer and forming at least one first trench in the wafer having first and second sidewalls and a first orientation on the wafer. The first sidewall of the at least one first trench is implanted with a dopant of a first conductivity at a first implantation direction. The first sidewall of the at least one first trench is implanted with the dopant of the first conductivity at a second implantation direction. The second implantation direction is orthogonal to the first implantation direction. The first and second implantation directions are non-orthogonal to the first sidewall.
1. A method of manufacturing a semiconductor device comprising:
(a) providing a semiconductor wafer;
(b) forming at least one first trench in the wafer, the at least one first trench having sidewalls and a first orientation on the wafer;
(c) forming at least one second trench in the wafer, the at least one second trench having sidewalls and a second orientation on the wafer, the second orientation being different from the first orientation;
(d) directing an ion implantation beam from a first implantation direction at the at least one first trench and the at least one second trench;
(e) directing an ion implantation beam from a second implantation direction at the at least one first trench and the at least one second trench, the second implantation direction being different than the first implantation direction by 90°;
(f) directing an ion implantation beam from a third implantation direction at the at least one first trench and the at least one second trench, the third implantation direction being different than the first implantation direction by 180°; and
(g) directing an ion implantation beam from a fourth implantation direction at the at least one first trench and the at least one second trench, the fourth implantation direction being different than the first implantation direction by 270°, the first, second, third, and fourth implantation directions being non-orthogonal to at least one of the first orientation and the second orientation.
2. The method of claim 1 , wherein the first orientation is orthogonal to the second orientation.
3. The method of claim 1 , wherein an angle between the first orientation and the second orientation is determined by a first desired effective implantation dose of the sidewalls of the at least one first trench and a second desired effective implantation dose of the sidewalls of the at least one second trench.
4. The method of claim 1 , wherein the steps (a)-(g) are performed sequentially.
5. The method of claim 1 , wherein prior to commencement of each of the steps (a)-(g), the respective preceding step is substantially completed.
6. The method of claim 1 , wherein prior to commencement of each of the steps (a)-(g), the respective preceding step is fully completed.
7. A semiconductor device formed by the method of claim 1 .