IP Library Granted Patent US 8,006,357
Granted Patent B2
US 8,006,357 · App. 11/813,551 · Granted Aug 30, 2011

Process for fabricating piezoelectric element

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Quick Facts
Patent No.
US 8,006,357
App. No.
11/813,551
Granted
Aug 30, 2011
Kind
B2
Abstract

In a production method of a piezoelectric element, an unneeded electric field is prevented from being applied to a piezoelectric thin film layer during the production process, resulting in a high performance piezoelectric element production method. The production method includes a first process for depositing an under electrode layer, a piezoelectric thin film layer and an upper electrode layer successively on a substrate such that the under electrode layer and the upper electrode layer form a short-circuit, a second process, after the first process, for etching including dry etching, the second process commenced while the under electrode layer and the upper electrode layer are short-circuited, a third process, after the second process, for polarizing by applying a voltage across the under electrode layer and the upper electrode layer, a fourth process, after the third process, for individualizing each piezoelectric element.

Claims (14)

1. A production method of a piezoelectric element comprising:

a first process for depositing an under electrode layer, a piezoelectric thin film layer and an upper electrode layer successively on a substrate such that the under electrode layer and the upper electrode layer form a short-circuit;

a second process, after the first process, for etching including dry etching, the second process commenced while the under electrode layer and the upper electrode layer are short-circuited;

a third process, after the second process, for polarizing by applying a voltage across the under electrode layer and the upper electrode layer; and

a fourth process, after the third process, for individualizing the element into independent units.

2. The production method of the piezoelectric element according to claim 1 , wherein the first process includes a process for short-circuiting the under electrode layer and the upper electrode layer by depositing the upper electrode layer.

3. The production method of the piezoelectric element according to claim 2 , wherein the first process includes a process for short-circuiting the upper electrode layer and under electrode layer by making a dimension of the piezoelectric thin film layer smaller than that of the under electrode layer and a dimension of the upper electrode layer larger than that of the piezoelectric thin film layer.

4. The production method of the piezoelectric element according to claim 1 , wherein the first process includes a process for short-circuiting the under electrode layer and the upper electrode layer with a conductive adhesive.

5. The production method of the piezoelectric element according to claim 1 , wherein the first process includes a process for short-circuiting the under electrode layer and the upper electrode layer with a wire bonding.

6. The production method of the piezoelectric element according to claim 1 , wherein the first process includes a process for short-circuiting the under electrode layer and the upper electrode layer with a conductive tape.

7. The production method of the piezoelectric element according to claim 1 , wherein the second process includes dry etching for shaping the piezoelectric element and then wet etching for breaking the short-circuit portion between the under electrode layer and the upper electrode layer.

8. The production method of the piezoelectric element according to claim 1 , wherein the third process includes breaking short-circuit portion between the under electrode layer and the upper electrode layer before the polarizing process starts.

9. The production method of the piezoelectric element according to claim 1 , wherein the third process includes a process for short-circuiting again the upper electrode layer and the under electrode layer after the polarizing process is finished, and

the fourth process includes a process for breaking the short-circuit portion between the under electrode layer and the upper electrode layer after dry etching process.

Assignments (2)
CHANGE OF NAME Recorded Nov 11, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021818/0725 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 29, 2007
From: NAKAMURA, YUKI; MURASHIMA, YUJI; YASUMI, MASAHIRO; KOMAKI, KAZUKI
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 020030/0174 →