IP Library Granted Patent US 8,080,871
Granted Patent B2
US 8,080,871 · App. 12/177,815 · Granted Dec 20, 2011

Carbon nanotube-based structures and methods for removing heat from solid-state devices

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Quick Facts
Patent No.
US 8,080,871
App. No.
12/177,815
Granted
Dec 20, 2011
Kind
B2
Abstract

One aspect of the invention includes a copper substrate; a catalyst on top of the copper substrate surface; and a thermal interface material that comprises a layer containing carbon nanotubes that contacts the catalyst. The carbon nanotubes are oriented substantially perpendicular to the surface of the copper substrate. A Raman spectrum of the layer containing carbon nanotubes has a D peak at ˜1350 cm −1 with an intensity ID, a G peak at ˜1585 cm −1 with an intensity IG, and an intensity ratio I D /I G of less than 0.7 at a laser excitation wavelength of 514 nm. The thermal interface material has: a bulk thermal resistance, a contact resistance at an interface between the thermal interface material and the copper substrate, and a contact resistance at an interface between the thermal interface material and a solid-state device. A summation of these resistances has a value of 0.06 cm 2 K/W or less.

Claims (57)

1. An article of manufacture, comprising:

a copper substrate with a surface;

a catalyst on top of the copper substrate surface; and

a thermal interface material that comprises a layer containing carbon nanotubes that contacts the catalyst, wherein

the carbon nanotubes are oriented substantially perpendicular to the surface of the copper substrate;

a Raman spectrum of the layer containing carbon nanotubes has a D peak at ˜1350 cm −1 with an intensity I D , a G peak at ˜1385 cm −1 with an intensity I G , and an intensity ratio I D /I G of less than 0.7 at a laser excitation wavelength of 514 nm;

the thermal interface material comprising the layer containing carbon nanotubes has:

a bulk thermal resistance,

a contact resistance at an interface between the thermal interface material and the copper substrate, and

a contact resistance at an interface between the thermal interface material and a solid-state device; and

a summation of the bulk thermal resistance, the contact resistance at the interface between the thermal interface material and the copper substrate, and the contact resistance at the interface between the thermal interface material and the solid-state device has a value of 0.06 cm 2 K/W or less.

2. The article of manufacture of claim 1 ,

wherein the summation of the bulk thermal resistance, the contact resistance at the interface between the thermal interface material and the copper substrate, and the contact resistance at the interface between the thermal interface material and the solid-state has a value of 0.03 cm 2 K/W or less.

3. The article of manufacture of claim 1 ,

wherein the summation of the bulk thermal resistance, the contact resistance at the interface between the thermal interface material and the copper substrate, and the contact resistance at the interface between the thermal interface material and the solid-state has a value of 0.02 cm 2 K/W or less.

4. The article of manufacture of claim 1 ,

wherein the summation of the bulk thermal resistance, the contact resistance at the interface between the thermal interface material and the copper substrate, and the contact resistance at the interface between the thermal interface material and the solid-state has a value of between 0.02-0.06 cm 2 K/W.

5. The article of manufacture of claim 1 , wherein the substrate includes copper that contains less than 40 parts per million (ppm) oxygen.

6. The article of manufacture of claim 1 , wherein the layer of carbon nanotubes has a coverage density of between about 15 to 40%.

7. An article of manufacture, comprising:

a heat spreader with a surface configured to face a solid-state device; and

a thermal interface material attached to the heat spreader comprising a layer of carbon nanotubes, wherein:

the carbon nanotubes are oriented substantially perpendicular to the surface of the heat spreader configured to face a solid-state device;

a Raman spectrum of the layer of carbon nanotubes has a D peak at ˜1350 cm −1 with an intensity I D , a G peak at ˜1385 cm −1 with an intensity I G , and an intensity ratio I D /I G of less than 0.7 at a laser excitation wavelength of 514 nm;

the thermal interface material comprising the layer containing carbon nanotubes has:

a bulk thermal resistance,

a contact resistance at an interface between the thermal interface material and the heat spreader configured to face the solid-state device, and

a contact resistance at an interface between the thermal interface material and a solid-state device; and

a summation of the bulk thermal resistance, the contact resistance at the interface between the thermal interface material and the surface of the heat spreader, and the contact resistance at the interface between the thermal interface material and the solid-state device has a value of 0.06 cm 2 K/W or less.

8. The article of manufacture of claim 7 ,

wherein the summation of the bulk thermal resistance, the contact resistance at the interface between the thermal interface material and the surface of the heat spreader configured to face the solid-state device, and the contact resistance at the interface between the thermal interface material and the solid-state has a value of 0.03 cm 2 K/W or less.

9. The article of manufacture of claim 7 ,

wherein the summation of the bulk thermal resistance, the contact resistance at the interface between the thermal interface material and the surface of the heat spreader configured to face the solid-state device, and the contact resistance at the interface between the thermal interface material and the solid-state has a value of 0.02 cm 2 K/W or less.

10. The article of manufacture of claim 7 ,

wherein the summation of the bulk thermal resistance, the contact resistance at the interface between the thermal interface material and the surface of the heat spreader configured to face the solid-state device, and the contact resistance at the interface between the thermal interface material and the solid-state has a value of between 0.02-0.06 cm 2 K/W.

11. The article of manufacture of claim 7 , wherein the thermal interface material is attached to the heat spreader by growing the layer of carbon nanotubes on the heat spreader.

12. The article of manufacture of claim 7 , wherein the thermal interface material is attached to the heat spreader by growing the layer of carbon nanotubes on a copper substrate and attaching the copper substrate to the heat spreader.

13. The article of manufacture of claim 12 , wherein the copper substrate is attached to the heat spreader by bonding the substrate to a recessed cavity in the heat spreader.

14. The article of manufacture of claim 7 , wherein the thermal interface material comprises a phase change material located between the carbon nanotubes.

15. The article of manufacture of claim 14 , wherein the phase change material comprises a wax.

16. The article of manufacture of claim 14 , wherein the phase change material comprises a paraffin.

17. The article of manufacture of claim 7 , wherein the solid-state device is an integrated circuit.

18. The article of manufacture of claim 7 , wherein a solid-state device may be removably connected to the thermal interface material.

19. The article of manufacture of claim 7 , wherein the thermal interface material is configured to enable a solid-state device to be connected to the thermal interface material, disconnected from the thermal interface material, and then reconnected to the thermal interface material.

20. The article of manufacture of claim 19 , wherein the solid-state device is an integrated circuit.

21. The article of manufacture of claim 7 , wherein the article of manufacture is configured to be reused to cool a succession of solid-state devices.

22. An article of manufacture, comprising:

a solid-state device;

a heat spreader with a surface facing the solid-state device; and

a thermal interface material attached to the heat spreader and contacting the solid-state device comprising a layer of carbon nanotubes, wherein:

the carbon nanotubes are oriented substantially perpendicular to the surface of the heat spreader configured to face a solid-state device;

a Raman spectrum of the layer of carbon nanotubes has a D peak at ˜1350 cm −1 with an intensity I D , a G peak at ˜1385 cm −1 with an intensity I G , and an intensity ratio I D /I G of less than 0.7 at a laser excitation wavelength of 514 nm;

the thermal interface material comprising the layer containing carbon nanotubes has:

a bulk thermal resistance,

a contact resistance at an interface between the thermal interface material and the heat spreader configured to face the solid-state device, an

a contact resistance at an interface between the thermal interface material and a solid-state device; and

a summation of the bulk thermal resistance, the contact resistance at the interface between the thermal interface material and the heat spreader, and the contact resistance at the interface between the thermal interface material and the solid-state device has a value of 0.06 cm 2 K/W or less.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 28, 2011
From: UNIDYM, INC.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 025875/0331 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 22, 2010
From: NANOCONDUCTION, INC.
To: UNIDYM, INC.
Reel/Frame 025390/0874 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 27, 2008
From: DANGELO, CARLOS; SUHIR, EPHRAIM; WACKER, BARBARA; XU, YUAN; ZHANG, YI; SCHWARTZ, PETER; DEY, SUBRATA; PADMAKUMAR, BALA
To: NANOCONDUCTION, INC.
Reel/Frame 021739/0394 →