IP Library Granted Patent US 8,102,713
Granted Patent B2
US 8,102,713 · App. 12/492,091 · Granted Jan 24, 2012

Non-volatile memory monitor

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Quick Facts
Patent No.
US 8,102,713
App. No.
12/492,091
Granted
Jan 24, 2012
Kind
B2
Abstract

The invention provides circuits, systems, and methods for monitoring a non-volatile memory (NVM) cell, or an array of NVM cells. The monitor is capable of switching from a normal operating state to an evaluation state, monitoring for one or more particular characteristics, and returning to the normal operating state. Alternative embodiments of the invention are disclosed using various triggers and producing outputs capable of reporting or feeding back to influence the operation of the monitoring systems and methods, the NVM circuitry, or an external system. The invention includes an energy conservation feature, in that no power is consumed in the normal operating state, and low power in the evaluation state.

Claims (37)

1. A method for monitoring a floating gate circuit comprising the steps of:

switching a monitor from a normal state to an evaluation state, whereby one or more electrical characteristic of one or more floating gate device is subsequently monitored;

evaluating the one or more monitored electrical characteristic of the one or more floating gate device with respect to one or more reference, thereby producing one or more output signal; and then

switching from the evaluation state to the normal state.

2. The method according to claim 1 further comprising one or more successive iterations of the evaluating step.

3. The method according to claim 1 wherein the step of switching a monitor from a normal state to an evaluation state further comprises using a trigger actuated by an external source.

4. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by a sensor.

5. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by a temperature sensor.

6. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by a moisture sensor.

7. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by a pressure sensor.

8. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by an electrical sensor.

9. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by an inertia sensor.

10. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by a particle sensor.

11. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by accepting a manual input.

12. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by a timer.

13. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by a timer, the timer actuated by a sensor.

14. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by a sensor, the sensor actuated by a timer.

15. The method according to claim 1 wherein the step of switching a monitor from a normal operating state to an evaluation state further comprises using a trigger actuated by a second sensor, the second sensor actuated by a first sensor.

16. The method according to claim 1 wherein the output signal further comprises an indication of the state of one or more non-volatile memory cell.

17. The method according to claim 1 wherein the output signal further comprises an analog value relating to a characteristic of one or more non-volatile memory cell.

18. The method according to claim 1 wherein the output signal further comprises a feedback signal for influencing the evaluating step.

19. The method according to claim 1 wherein the output signal further comprises a feedback signal for influencing one or more non-volatile memory cell value.

20. The method according to claim 1 wherein the output signal further comprises a feedback signal for influencing one or more electrical characteristic of the non-volatile memory circuit.

21. The method according to claim 1 wherein the output signal further comprises a feedback signal for influencing one or more electrical characteristic in a system associated with the non-volatile memory circuit.

22. The method according to claim 1 wherein the reference further comprises one or more floating gate charge.

23. The method according to claim 1 wherein the reference further comprises one or more band gap reference.

24. The method according to claim 1 wherein the reference further comprises one or more external signal.

25. A system for monitoring a non-volatile memory circuit comprising:

an evaluation module operably coupled to the non-volatile memory circuit for reading one or more non-volatile memory cells, and for reading one or more reference, whereby an evaluation signal may be provided;

a control module operably coupled for receiving the evaluation signal from the evaluation module, the control module configured for providing one or more output signal; and

a trigger module operably coupled for switching the system between an evaluation state for monitoring the non-volatile memory circuit and a normal state.

26. The system according to claim 25 wherein the reference further comprises one or more floating gate having a stored charge.

27. The system according to claim 25 wherein the reference further comprises one or more band gap reference.

28. The system according to claim 25 wherein the reference further comprises one or more external signal.

29. The system according to claim 25 further comprising an adjusting module operably coupled to the control module for adjusting one or more electrical characteristics of the system.

30. The system according to claim 25 further comprising an adjusting module operably coupled for providing an adjusting charge to one or more non-volatile memory cells.

31. The system according to claim 25 wherein the evaluation module further comprises polling means for reading a plurality of non-volatile memory cells and for providing one or more polled evaluation signal to the control module.

Assignments (4)
ASSIGNMENT OF PATENT SECURITY INTEREST PREVIOUSLY RECORDED AT REEL/FRAME (040646/0799) Recorded Feb 17, 2023
From: HSBC BANK USA, NATIONAL ASSOCIATION, AS RESIGNING AGENT
To: JPMORGAN CHASE BANK, N.A., AS SUCCESSOR AGENT
Reel/Frame 062781/0544 →
SECURITY INTEREST Recorded Nov 17, 2016
From: SEMTECH CORPORATION; SEMTECH NEW YORK CORPORATION; SIERRA MONOLITHICS, INC.; SEMTECH EV, INC.; TRIUNE SYSTEMS, L.L.C.; TRIUNE IP, LLC
To: HSBC BANK USA, NATIONAL ASSOCIATION, AS ADMINISTRATIVE AGENT
Reel/Frame 040646/0799 →
SECURITY INTEREST Recorded May 28, 2015
From: TRIUNE IP, LLC
To: HSBC BANK USA, NATIONAL ASSOCIATION
Reel/Frame 035732/0326 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2009
From: TEGGATZ, ROSS E.; CHEN, WAYNE T.; SMITH, BRETT E.
To: TRIUNE IP LLC
Reel/Frame 023661/0330 →