IP Library › Granted Patent US 842,144
Granted Patent S1
US 842,144 · App. 29/614,126 · Granted Mar 5, 2019

Module for use in a test instrument

Inventors: Michel Blier (Montreal, CA); Patrice Gonay (St-Gabriel de Valcartier, CA); Sebastien Nadeau (Saint-Augustin-de-Desmaures, CA); Pascal Recoura-Massaquant (Quebec, CA)
Assignee: EXFO Inc.
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Quick Facts
Patent No.
US 842,144
App. No.
29/614,126
Granted
Mar 5, 2019
Kind
S1
Claims (1)

The ornamental design for a module for use in a test instrument, as shown and described.

Assignments (2)
SECURITY INTEREST Recorded Aug 8, 2025
From: EXFO INC. (A CORPORATION RESULTING FROM THE AMALGAMATION OF 11172239 CANADA INC. AND EXFO INC.); ONTOLOGY-PARTNERS LIMITED
To: NATIONAL BANK OF CANADA
Reel/Frame 072338/0500 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 31, 2017
From: BLIER, MICHEL; GONAY, PATRICE; NADEAU, SEBASTIEN; RECOURA-MASSAQUANT, PASCAL
To: EXFO INC.
Reel/Frame 043992/0025 →
Continuity (1)
Division 29547809 · Dec 8, 2015