Embedded dynamic random access memory field effect transistor device

1. A method comprising:

forming a cavity in a substrate;

depositing a silicon material in the cavity;

forming a fin in the substrate and the silicon material such that a first portion of the fin is formed from the substrate and a second portion of the fin is formed from the deposited silicon material;

forming a gate stack over the fin;

growing an oxide material over the first portion of the fin and the second portion of the fin;

removing the oxide material from the first portion of the fin;

growing an epitaxial material on an exposed portion of the first portion of the fin;

removing the oxide material from the second portion of the fin; and

growing an epitaxial material on an exposed portion of the second portion of the fin.

2. The method of claim 1 , wherein the substrate includes a crystalline silicon material.

3. The method of claim 1 , wherein the silicon material deposited in the cavity includes a polysilicon material.

4. The method of claim 1 , wherein the fin is formed in the substrate and the silicon material by patterning and removing portions of the substrate and silicon material to define the fin.

5. The method of claim 1 , wherein the growing the oxide material results in a layer of oxide material on the first portion of the fin having a thickness less than a thickness of a layer of oxide material on the second portion of the fin.

6. The method of claim 1 , wherein the oxide material from the first portion of the fin is removed using a chemical process.

7. A method comprising:

forming a fin on a substrate, the fin having a first portion comprising a first material and a second portion comprising a second material;

growing a layer of oxide material on the first portion of the fin and the second portion of the fin, wherein the layer of oxide material on the first portion of the fin has a thickness smaller than a thickness of the layer of oxide material on the second portion of the fin;

removing the layer of oxide material from the first portion of the fin to expose the first portion of the fin;

growing an epitaxial material on the exposed first portion of the fin;

removing the layer of oxide material from the second portion of the fin to expose the second portion of the fin; and

growing an epitaxial material on the exposed second portion of the fin.

8. The method of claim 7 , wherein the growing the epitaxial material on the exposed second portion of the fin includes growing additional epitaxial material on the first portion of the fin.

9. The method of claim 7 , wherein the first material includes a crystalline silicon material.

10. The method of claim 7 , wherein the second material includes a polysilicon material.

11. The method of claim 7 , further comprising forming a gate stack over the fin prior to growing the layer of oxide material.

12. The method of claim 7 , wherein the epitaxial material grows on the second material at a faster rate than on the first material.

13. The method of claim 7 , wherein the thickness of the layer of oxide material on the second portion of the fin is reduced while removing the layer of oxide material from the first portion of the fin.

14. A method comprising:

forming a cavity in a crystalline silicon substrate;

depositing a first layer of polysilicon material in the cavity;

depositing an oxide material in the cavity on the first layer of polysilicon material;

depositing a second layer of polysilicon material over the first layer of polysilicon material and the oxide material;

forming a fin in the crystalline silicon substrate and the second layer of polysilicon material such that a first portion of the fin is formed from the crystalline silicon substrate and a second portion of the fin is formed from the deposited second layer of polysilicon material;

removing a portion of the fin and a portion of the second layer of polysilicon material to expose the oxide material in the cavity;

forming a gate stack in the cavity;

forming a layer of oxide material over exposed portions of the fin, wherein the layer of oxide material formed over the portion of the second layer of polysilicon material has a greater thickness than the layer of oxide material formed over the first portion of the fin formed from the crystalline silicon substrate material;

removing the layer of oxide material formed over the first portion of the fin formed from the crystalline silicon substrate;

growing an epitaxial silicon material on exposed portions of the first portion of the fin formed from the crystalline silicon substrate;

removing the layer of oxide material formed over the second portion of the fin formed from the second layer of polysilicon material; and

growing an epitaxial silicon material on exposed portions of the second portion of the fin formed from the second layer of polysilicon material.

15. The method of claim 14 , wherein a growth rate of the layer of oxide material is greater on the second portion of the fin formed from the second layer of polysilicon material than on the first portion of the fin formed from the crystalline silicon substrate.

16. The method of claim 14 , wherein the growth rate of the epitaxial silicon material is greater on the second portion of the fin formed from the second layer of polysilicon material than on the first portion of the fin formed from the crystalline silicon substrate.

17. The method of claim 14 , wherein the growing the epitaxial silicon material on exposed the second portion of the fin formed from the second layer of polysilicon material further included growing additional epitaxial silicon material on the first portion of the fin formed from the crystalline silicon substrate.

18. The method of claim 14 , wherein the gate stack is formed in the cavity and over a portion of the fin.

19. The method of claim 14 , wherein the layer of oxide material is removed using a chemical process.

20. The method of claim 14 , wherein the removal of the layer of oxide material from the first portion of the fin formed from the crystalline silicon substrate includes reducing the thickness of the oxide material formed over the second portion of the fin formed from the second layer of polysilicon material.