System and method for acquiring electrical measurements of an electronic device

1. A method for acquiring electrical measurements of an electronic device, said method comprising:

securing an elastomeric connector at least partially inside a cavity within a truncated front end of an electrical probe, wherein the electrical probe is physically and electrically coupled to an electric cable;

physically and electrically coupling the electric cable to a data processor;

electrically connecting the elastomeric connector end to said electronic device; and

outputting electrical measurement data from the elastomeric connector end through the electric cable to said data processor;

wherein the elastomeric connector comprises at least one protective layer defining two opposing walls, an inner wall of the at least one protective layer being in physical contact with an outer wall of a nonconductive layer and an outer wall of the at least one protective layer being in physical contact with the cavity; and

wherein the at least one protective layer is comprised of silicone rubber material having a solid composition or a porous composition.

2. The method of claim 1 , wherein the elastomeric connector comprises at least one conductive layer defining two opposing walls and at least two nonconductive layers, each nonconductive layer defining two opposing walls, an inner wall of one of the nonconductive layers being in physical contact with one wall of the at least one conductive layer and an inner wall of another nonconductive layer being in physical contact with the other wall of the at least one conductive layer.

3. The method of claim 2 , wherein at least one of:

the at least one conductive layer is comprised of carbon filled silicone rubber material; or

each nonconductive layer is comprised of silicone rubber material.

4. The method of claim 2 , wherein the at least one conductive layer and each nonconductive layer have a height dimension that is equal to at least 1.5 times the width dimension.

5. The method of claim 1 , wherein the elastomeric connector comprises at least one nonconductive layer defining two opposing faces, the at least one nonconductive layer comprising at least one conductive pathway extending between the faces.

6. The method of claim 5 , wherein at least one of:

the at least one nonconductive layer is comprised of silicone rubber material; or

the at least one conductive pathway is comprised of gold-plated phosphor bronze material.

7. The method of claim 1 , wherein the at least one protective layer is selected from a group consisting of an insulator and a supporter.

8. The method of claim 1 , wherein the data processor is an electronic testing equipment.

9. The method of claim 1 , wherein the electronic device comprises an element adapted to enable electrical connection.

10. The method of claim 9 , wherein the element is a pin or a wire.

11. The method of claim 1 , wherein the truncated front end has at least one tapered side wall.

12. An electrical probe comprising:

an elongated support adapted to be physically and electrically coupled to an electric cable, wherein the electric cable is physically and electrically coupled to a data processor;

a truncated front end physically and electrically coupled to the support;

a cavity within the front end; and

an elastomeric connector adapted to at least partially fit inside the cavity, the elastomeric connector enabling electrical connection to an electronic device;

wherein the elastomeric connector comprises at least one protective layer defining two opposing walls, an inner wall of the at least one protective layer being in physical contact with an outer wall of a nonconductive layer and an outer wall of the at least one protective layer being in physical contact with the cavity; and

wherein the at least one protective layer is comprised of silicone rubber material having a solid composition or a porous composition.

13. The electrical probe of claim 12 , wherein the elastomeric connector comprises at least one conductive layer defining two opposing walls and at least two nonconductive layers, each nonconductive layer defining two opposing walls, an inner wall of one of the nonconductive layers being in physical contact with one wall of the at least one conductive layer and an inner wall of another nonconductive layer being in physical contact with the other wall of the at least one conductive layer.

14. The electrical probe of claim 13 , wherein at least one of:

the at least one conductive layer is comprised of carbon-filled silicone rubber material; or

each nonconductive layer is comprised of silicone rubber material.

15. The electrical probe of claim 13 , wherein the at least one conductive layer and each nonconductive layer have a height dimension that is equal to at least 1.5 times the width dimension.

16. The electrical probe of claim 12 , wherein the elastomeric connector comprises at least one nonconductive layer defining two opposing faces and at least one conductive pathway extending between the faces.

17. The electrical probe of claim 16 , wherein at least one of:

the at least one nonconductive layer is comprised of silicone rubber material; or

the at least one conductive pathway is comprised of gold-plated phosphor bronze material.

18. The electric probe of claim 12 , wherein the at least one protective layer is selected from a group consisting of an insulator and a supporter.

19. The electric probe of claim 12 , wherein the data processor is an electronic testing equipment.

20. The electric probe of claim 12 , wherein the electronic device comprises an element adapted to enable electrical connection.

21. The electric probe of claim 20 , wherein the element is a pin or a wire.

22. The electric probe of claim 16 , wherein the front end has at least one tapered side wall.