IP Library Granted Patent US 10,038,522
Granted Patent B1
US 10,038,522 · App. 15/460,672 · Granted Jul 31, 2018

Modular PIM analyzer and method using the same

Inventors: Jae Hyun Ju (Incheon, KR); Jun Ho Kang (Seoul, KR); Hak Rae Cho (Gyeonggi-do, KR); Moon Bong Ko (Incheon, KR)
Assignee: INNERTRON, INC.
H04L1/206H04L1/244H04L1/247
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Quick Facts
Patent No.
US 10,038,522
App. No.
15/460,672
Granted
Jul 31, 2018
Kind
B1
Abstract

A modular PIM analyzer includes: a first signal amplification module provided with a first signal generator for generating a first frequency signal under control of a first MCU, and a first power amplifier for generating a first amplified frequency signal through the amplification of the first frequency signal under control of a first ALC circuit; a second signal amplification module provided with a second signal generator for generating a second frequency signal under control of a second MCU, and a second power amplifier for generating a second amplified frequency signal through the amplification of the second frequency signal under control of a second ALC circuit; and a triplexer module for extracting a test frequency signal using the first amplified frequency signal and the second amplified frequency signal, transmitting the test frequency signal to a device under test, and receiving a PIM signal being reflected from the device under test.

Claims (34)

1. A modular PIM (passive inter-modulation) analyzer comprising:

a first signal amplification module provided with a first signal generator for generating a first frequency signal under the control of a first MCU (micro control unit), and a first power amplifier for generating a first amplified frequency signal through the amplification of the first frequency signal under the control of a first ALC (automatic level control) circuit;

a second signal amplification module provided with a second signal generator for generating a second frequency signal under the control of a second MCU, and a second power amplifier for generating a second amplified frequency signal through the amplification of the second frequency signal under the control of a second ALC circuit; and

a triplexer module for extracting a test frequency signal using the first amplified frequency signal and the second amplified frequency signal, transmitting the test frequency signal to a device under test, and receiving a PIM signal being reflected from the device under test,

wherein the first signal amplification module further includes a mixer electrically connected to the first MCU, and

wherein the mixer converts a frequency of a received coupling frequency signal based on a predetermined frequency, and transmits the converted coupling frequency signal to the first MCU.

2. A modular PIM analyzer according to claim 1 , wherein

the first signal amplifier module, the second signal amplifier module, or the triplexer module is detachable for replacement according to a frequency band of the device under test.

3. A modular PIM analyzer according to claim 1 , wherein

the triplexer module further includes a directional coupler for coupling the test frequency signal and a divider for separating the coupled signal from the divider for generating a coupling frequency signal; and

wherein the coupling frequency signal is transmitted to the first signal amplification module or the second signal amplifier module.

4. A modular PIM analyzer according to claim 1 , wherein

the first signal amplification module further includes a directional coupler for generating a coupling frequency signal through coupling of the first amplified frequency signal; and

wherein the coupling frequency signal is transmitted to the first MCU.

5. A modular PIM analyzer according to claim 1 , wherein

the converted coupling frequency signal is obtained as a signal having a frequency whose frequency is subtracted from the frequency of the received coupling frequency signal by the predetermined frequency value.

6. A modular PIM analyzer according to claim 1 , wherein

the first MCU controls the first signal generator based on a coupling frequency signal and an estimated frequency signal estimated from the value of the coupling frequency signal; and

wherein the coupling frequency signal is one of a signal coupled from the first amplified frequency signal or a signal coupled and divided from the test frequency signal.

7. A modular PIM analyzer according to claim 1 , wherein

the first MCU controls the first signal generator in a way that when there is a difference between a coupling frequency signal and an estimated frequency signal estimated from the value of the coupling frequency signal, a signal for canceling the difference is generated; and

wherein the coupling frequency signal is one of a signal coupled from the first amplified frequency signal or a signal coupled and divided from the test frequency signal.

8. A modular PIM analyzer according to claim 1 , further comprising:

an analysis module generating information related to PIM based on the PIM signal.

9. A modular PIM analyzer according to claim 8 , wherein

the analysis module transmits the information related to PIM to the external devices.

10. A method for analyzing PIM (passive inter-modulation) using a modular PIM analyzer including the steps of:

generating a first amplified frequency signal wherein a first signal amplification module generates a first frequency signal under the control of a first MCU, and the first frequency signal is amplified under the control of a first ALC circuit;

generating a second amplified frequency signal wherein a second signal amplification module generates a second frequency signal under the control of a second MCU, and the second frequency signal is amplified under the control of a second ALC circuit;

transmitting a test frequency signal wherein a triplexer module extracts a test frequency signal using the first amplified frequency signal and the second amplified frequency signal, and transmits the test frequency signal to a device under test;

receiving a PIM signal wherein the triplexer module receives the PIM signal reflected from the device under test depending on the transmission of the test frequency signal; and

generating information related to PIM wherein an analysis module generates the information related to PIM based on the PIM signal,

wherein the first signal amplification module further includes a mixer electrically connected to the first MCU, and

wherein the mixer converts a frequency of a received coupling frequency signal based on a predetermined frequency, and transmits the converted coupling frequency signal to the first MCU.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 16, 2017
From: JU, JAE HYUN; KANG, JUN HO; CHO, HAK RAE; KO, MOON BONG
To: INNERTRON, INC.
Reel/Frame 042025/0266 →
Priority Claims (1)
KR 10-2017-0014531 · Feb 1, 2017 · national
Cited By (1)
US 12,267,096