Optical time-domain reflectometer device including combined trace display

1. An optical time-domain reflectometer (OTDR) device comprising:

a laser source to emit a plurality of laser beams, each laser beam including a different pulse width; and

a control unit, executed by at least one hardware processor, to:

analyze, for each laser beam, a backscattered signal from a device under test (DUT);

generate, for each backscattered signal, a trace along the DUT; and

generate, based on an analysis of each trace along the DUT, a combined trace that identifies optical events detected along the DUT by interpolating a combined trace section between two non-adjacent combined trace sections of the combined trace to form the combined trace.

2. The OTDR device according to claim 1 , wherein the DUT includes an optical fiber.

3. The OTDR device according to claim 1 , wherein the control unit is to generate, based on the analysis of each trace along the DUT, the combined trace that identifies optical events detected along the DUT by:

determining, for each analyzed trace along the DUT, whether a respective trace section of an analyzed trace is to be included in the combined trace;

based on a determination that the respective trace section of the analyzed trace is to be included in the combined trace, including the respective trace section in the combined trace; and

based on a determination that the respective trace section of the analyzed trace is to not be included in the combined trace, excluding the respective trace section from the combined trace.

4. The OTDR device according to claim 3 , wherein the control unit is to determine, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace is to be included in the combined trace by:

determining, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace includes an optical event; and

based on a determination that the respective trace section of the analyzed trace includes the optical event, including the respective trace section in the combined trace.

5. The OTDR device according to claim 4 , wherein the control unit is to:

determine, for a respective trace section included in the combined trace, whether a further trace section is adjacent to an optical event for the respective trace section included in the combined trace; and

based on a determination that the further trace section is adjacent to the optical event for the respective trace section included in the combined trace, determine, for the combined trace, a single point that accounts for the further trace section and the optical event for the respective trace section included in the combined trace.

6. The OTDR device according to claim 3 , wherein the control unit is to determine, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace is to be included in the combined trace by:

determining, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace includes a plurality of optical events; and

based on a determination that the respective trace section of the analyzed trace includes the plurality of optical events, including the respective trace section in the combined trace.

7. The OTDR device according to claim 3 , wherein the control unit is to determine, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace is to be included in the combined trace by:

determining, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace meets a quality criterion; and

based on a determination that the respective trace section of the analyzed trace does not meet the quality criterion, excluding the respective trace section from the combined trace.

8. The OTDR device according to claim 1 , wherein the pulse width of one of the two non-adjacent combined trace sections is different from the pulse width of another one of the two non-adjacent combined trace sections.

9. The OTDR device according to claim 1 , wherein the control unit is to:

reduce a length of the interpolated combined trace section by including, from an analyzed trace, an intermediate section that does not include an optical event.

10. The OTDR device according to claim 1 , wherein the control unit is to generate, based on the analysis of each trace along the DUT, the combined trace that identifies optical events detected along the DUT by:

selecting, based on the analysis of each trace along the DUT, a plurality of trace sections from the analyzed traces; and

connecting the selected plurality of trace sections to generate the combined trace.

11. The OTDR device according to claim 1 , wherein

the laser source is to emit a further laser beam including a further different pulse width, and

the control unit is to:

analyze, for the further laser beam, a further backscattered signal from the DUT;

generate, for the further backscattered signal, a further trace along the DUT; and

update, based on a further analysis of the further trace along the DUT, the combined trace that identifies the optical events detected along the DUT.

12. An optical time-domain reflectometer (OTDR) device comprising:

a laser source to emit

a first set of a plurality of laser beams, each laser beam of the first set including a different pulse width and a first specified wavelength, and

a second set of a plurality of laser beams, each laser beam of the second set including a different pulse width and a second specified wavelength; and

a control unit to:

analyze, for each laser beam of the first set and the second set, a backscattered signal from a device under test (DUT);

generate, for each backscattered signal for the first set and the second set, a trace along the DUT; and

generate, based on an analysis of each trace along the DUT;

a first combined trace that identifies optical events detected along the DUT for the first set by interpolating a combined trace section between two non-adjacent combined trace sections of the first combined trace to form the first combined trace, and

a second combined trace that identifies optical events detected along the DUT for the second set.

13. The OTDR device according to claim 12 , wherein the DUT includes an optical fiber.

14. A computer implemented method comprising:

emitting a plurality of laser beams, each laser beam including a different pulse width;

analyzing, for each laser beam, a backscattered signal from a device under test (DUT);

generating, for each backscattered signal, a trace along the DUT; and

generating, based on an analysis of each trace along the DUT, a combined trace that identifies optical events detected along the DUT by

determining, for each analyzed trace along the DUT, whether a respective trace section of an analyzed trace is to be included in the combined trace, and

based on a determination that no respective trace section of the analyzed trace meets a quality criteria, interpolating a combined trace section where no respective trace section is included in the combined trace.

15. The method according to claim 14 , wherein the DUT includes an optical fiber.

16. The method according to claim 14 , wherein generating, based on the analysis of each trace along the DUT, the combined trace that identifies optical events detected along the DUT further comprises:

based on a determination that the respective trace section of the analyzed trace is to be included in the combined trace, including the respective trace section in the combined trace; and

based on a determination that the respective trace section of the analyzed trace is to not be included in the combined trace, excluding the respective trace section from the combined trace.

17. The method according to claim 16 , wherein determining, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace is to be included in the combined trace further comprises:

determining, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace includes an optical event; and

based on a determination that the respective trace section of the analyzed trace includes the optical event, including the respective trace section in the combined trace.

18. The method according to claim 17 , further comprising:

determining, for a respective trace section included in the combined trace, whether a further trace section is adjacent to an optical event for the respective trace section included in the combined trace; and

based on a determination that the further trace section is adjacent to the optical event for the respective trace section included in the combined trace, determining, for the combined trace, a single point that accounts for the further trace section and the optical event for the respective trace section included in the combined trace.

19. The method according to claim 16 , wherein determining, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace is to be included in the combined trace further comprises:

determining, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace includes a plurality of optical events; and

based on a determination that the respective trace section of the analyzed trace includes the plurality of optical events, including the respective trace section in the combined trace.

20. The method according to claim 16 , wherein determining, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace is to be included in the combined trace further comprises:

determining, for each analyzed trace along the DUT, whether the respective trace section of the analyzed trace meets the quality criterion; and

based on a determination that the respective trace section of the analyzed trace does not meet the quality criterion, excluding the respective trace section from the combined trace.