Storage systems implementing offset erasure code stripes

1. An erasure code protected storage system, comprising:

a processor; and

logic integrated with the processor, executable by the processor, or integrated with and executable by the processor, the logic being configured to, for erasure code stripes in storage units:

select, by the processor, strips from each storage unit for a given erasure code stripe such that the given erasure code stripe includes at most one strip from a high failure rate region of the respective storage unit, wherein each of the storage units include high failure rate regions and low failure rate regions;

organize, by the processor, the selected strips such that a number of each strip in the given erasure code stripe is offset from the remaining strips by an amount that is greater than a total number of strips in the high failure rate regions; and

map, by the processor, the organized selected strips to form the given erasure code stripe,

wherein the high failure rate regions on each storage unit are mapped to one or more sequentially numbered strips,

wherein the low failure rate regions are mapped to additional sequentially numbered strips.

2. The erasure code protected storage system of claim 1 , wherein organizing the selected strips includes:

dividing the strips into N sequentially numbered sets of strips, where N is a number of devices in an erasure code group,

wherein the strips in the given erasure code stripe are each selected from different sets.

3. The erasure code protected storage system of claim 1 , wherein the erasure code stripes are multi-dimensional, wherein organizing the selected strips includes:

dividing the strips into M sequentially numbered sets of strips, where M is a number of devices on dimension of an erasure code group,

wherein the strips in the given erasure code stripe are each selected from different sets.

4. The erasure code protected storage system of claim 1 , wherein the high failure rate regions on each storage unit are mapped to one or more contiguously numbered strips, wherein selecting strips from each storage unit for the given erasure code stripe includes:

selecting strips that are each offset from the remaining strips by an amount that is greater than a total number of strips in the high failure rate regions.

5. The erasure code protected storage system of claim 1 , wherein the storage units are optical disks.

6. The erasure code protected storage system of claim 5 , wherein the high failure rate regions are located near an outer diameter of each of the optical disks.

7. The erasure code protected storage system of claim 5 , wherein the high failure rate regions are located in areas of high contamination and/or damage on a surface of at least some of the optical disks.

8. The erasure code protected storage system of claim 1 , comprising:

one or more hard disk drives.

9. The erasure code protected storage system of claim 1 , comprising:

one or more solid state drives.

10. A computer-implemented method for enabling erasure code protection for storage units, comprising, for erasure code stripes in the storage units:

selecting strips from each storage unit for a given erasure code stripe such that the given erasure code stripe includes at most one strip from a high failure rate region of the respective storage unit, wherein each of the storage units include high failure rate regions and low failure rate regions;

organizing the selected strips such that a number of each strip in the given erasure code stripe is offset from the remaining strips by an amount that is greater than a total number of strips in the high failure rate regions; and

mapping the organized selected strips to form the given erasure code stripe,

wherein the high failure rate regions on each storage unit are mapped to one or more sequentially numbered strips,

wherein the low failure rate regions are mapped to additional sequentially numbered strips.

11. The computer-implemented method of claim 10 , wherein organizing the selected strips includes:

dividing the strips into N sequentially numbered sets of strips, where N is a number of devices in an erasure code group,

wherein the strips in the given erasure code stripe are each selected from different sets.

12. The computer-implemented method of claim 10 , wherein the erasure code stripes are multi-dimensional, wherein organizing the selected strips includes:

dividing the strips into M sequentially numbered sets of strips, where M is a number of devices on dimension of an erasure code group,

wherein the strips in the given erasure code stripe are each selected from different sets.

13. The computer-implemented method of claim 10 , wherein the high failure rate regions on each storage unit are mapped to one or more contiguously numbered strips, wherein selecting strips from each storage unit for the given erasure code stripe includes:

selecting strips that are each offset from the remaining strips by an amount that is greater than a total number of strips in the high failure rate regions.

14. The computer-implemented method of claim 10 , wherein the storage units are optical disks.

15. The computer-implemented method of claim 14 , wherein the high failure rate regions are located near an outer diameter of each of the optical disks.

16. The computer-implemented method of claim 14 , wherein the high failure rate regions are located in areas of high contamination and/or damage on a surface of at least some of the optical disks.

17. A computer program product for enabling erasure code protection for storage units, the computer program product comprising a computer readable storage medium having program instructions embodied therewith, the program instructions readable and/or executable by a processor to cause the processor to, for erasure code stripes in the storage units:

select, by the processor, strips from each storage unit for a given erasure code stripe such that the given erasure code stripe includes at most one strip from a high failure rate region of the respective storage unit, wherein each of the storage units include high failure rate regions and low failure rate regions;

organize, by the processor, the selected strips such that a number of each strip in the given erasure code stripe is offset from the remaining strips by an amount that is greater than a total number of strips in the high failure rate regions; and

map, by the processor, the organized selected strips to form the given erasure code stripe,

wherein the high failure rate regions on each storage unit are mapped to one or more sequentially numbered strips,

wherein the low failure rate regions are mapped to additional sequentially numbered strips.

18. The computer program product of claim 17 , wherein organizing the selected strips includes:

dividing the strips into N sequentially numbered sets of strips, where N is a number of devices in an erasure code group,

wherein the strips in the given erasure code stripe are each selected from different sets.

19. The computer program product of claim 17 , wherein the erasure code stripes are multi-dimensional, wherein organizing the selected strips includes:

dividing the strips into M sequentially numbered sets of strips, where M is a number of devices on dimension of an erasure code group,

wherein the strips in the given erasure code stripe are each selected from different sets.

20. The computer program product of claim 17 , wherein the high failure rate regions on each storage unit are mapped to one or more contiguously numbered strips, wherein selecting strips from each storage unit for the given erasure code stripe includes:

selecting strips that are each offset from the remaining strips by an amount that is greater than a total number of strips in the high failure rate regions.

21. The computer program product of claim 17 , wherein the storage units are optical disks.

22. The computer program product of claim 21 , wherein the high failure rate regions are located near an outer diameter of each of the optical disks.

23. The computer program product of claim 21 , wherein the high failure rate regions are located in areas of high contamination and/or damage on a surface of at least some of the optical disks.