Source and drain enabled conduction triggers and immunity tolerance for integrated circuits
Integrated circuits with enhanced EOS/ESD robustness and methods of designing same. One such integrated circuit includes a plurality of input/output pads, a positive voltage rail, a ground voltage rail, a collection of internal circuits representing the operational core of the integrated circuit, a plurality of input/output buffering circuits connected as inputs and outputs to the internal circuits, wherein the internal circuits and the input/output buffering circuits comprise functional devices, and a plurality of EOS/ESD protection circuits interconnected with the input/output pads to limit ESD voltage and/or shunt ESD current away from the functional devices. At least one of the EOS/ESD protection circuits is a MOSFET. The MOSFET has a source region having an accompanying ohmic contact. The MOSFET further has a rectifying junction contact in place of a drain region and accompanying ohmic contact.
1. An integrated circuit with enhanced EOS/ESD robustness, comprising:
a plurality of input/output pads;
a positive voltage rail;
a ground voltage rail;
a collection of internal circuits representing the operational core of the integrated circuit;
a plurality of input/output buffering circuits connected as inputs and outputs to the internal circuits, wherein the internal circuits and the input/output buffering circuits comprise functional devices; and
a plurality of EOS/ESD protection circuits interconnected with the input/output pads to limit ESD voltage and/or shunt ESD current away from the functional devices;
wherein at least one of the EOS/ESD protection circuits is a MOSFET, wherein the MOSFET has a source region having an accompanying ohmic contact, and wherein the MOSFET further has a rectifying junction contact in place of a drain region and accompanying ohmic contact; and
wherein the at least one EOS/ESD protection circuit has a first I-V characterization curve having a first snapback voltage, wherein at least one of the functional devices has a second I-V characterization curve having a second snapback voltage, and wherein the rectifying junction contact in the at least one EOS/ESD protection circuit causes the first snapback voltage to be less than the second snapback voltage.
2. The integrated circuit of claim 1 , wherein the MOSFET is a PMOS device.
3. The integrated circuit of claim 1 , wherein the MOSFET is an NMOS device.
4. An integrated circuit with enhanced EOS/ESD robustness, comprising:
a plurality of input/output pads;
a positive voltage rail;
a ground voltage rail;
a collection of internal circuits representing the operational core of the integrated circuit;
a plurality of input/output buffering circuits connected as inputs and outputs to the internal circuits, wherein the internal circuits and the input/output buffering circuits comprise functional devices; and
a plurality of EOS/ESD protection circuits interconnected with the input/output pads to limit ESD voltage and/or shunt ESD current away from the functional devices;
wherein at least one of the functional devices includes a MOSFET, wherein the MOSFET has a drain region having an accompanying ohmic contact, and wherein the MOSFET further has a rectifying junction contact in place of a source region and accompanying ohmic contact; and
wherein the at least one functional device has a first I-V characterization curve having a first snapback current, wherein at least one of the EOS/ESD protection circuits has a second I-V characterization curve having a second snapback current, and wherein the rectifying junction contact in the at least one functional device causes the first snapback current to be greater than the second snapback current.
5. The integrated circuit of claim 4 , wherein the MOSFET is a PMOS device.
6. The integrated circuit of claim 4 , wherein the MOSFET is an NMOS device.
7. The integrated circuit of claim 4 , wherein the at least one functional device is an internal circuit.
8. The integrated circuit of claim 4 , wherein the at least one functional device is an input/output buffering circuit.
9. An integrated circuit with enhanced EOS/ESD robustness, comprising:
a plurality of input/output pads;
a positive voltage rail;
a ground voltage rail;
a collection of internal circuits representing the operational core of the integrated circuit;
a plurality of input/output buffering circuits connected as inputs and outputs to the internal circuits, wherein the internal circuits and the input/output buffering circuits comprise functional devices; and
a plurality of EOS/ESD protection circuits interconnected with the input/output pads to limit ESD voltage and/or shunt ESD current away from the functional devices;
wherein at least one of the functional devices includes a bipolar junction transistor (BJT), wherein the BJT has a collector region having an accompanying ohmic contact, and wherein the BJT further has a rectifying junction contact in place of an emitter region and accompanying ohmic contact; and
wherein the at least one functional device has a first I-V characterization curve having a first snapback current, wherein at least one of the EOS/ESD protection circuits has a second I-V characterization curve having a second snapback current, and wherein the rectifying junction contact in the at least one functional device causes the first snapback current to be greater than the second snapback current.
10. The integrated circuit of claim 9 , wherein the at least one functional device is an internal circuit.
11. The integrated circuit of claim 9 , wherein the at least one functional device is an input/output buffering circuit.
12. An integrated circuit with enhanced EOS/ESD robustness, comprising:
a plurality of input/output pads;
a positive voltage rail;
a ground voltage rail;
a collection of internal circuits representing the operational core of the integrated circuit;
a plurality of input/output buffering circuits connected as inputs and outputs to the internal circuits, wherein the internal circuits and the input/output buffering circuits comprise functional devices; and
a plurality of EOS/ESD protection circuits interconnected with the input/output pads to limit ESD voltage and/or shunt ESD current away from the functional devices;
wherein at least one of the EOS/ESD protection circuits is a bipolar junction transistor (BJT), wherein the BJT has an emitter region having an accompanying ohmic contact, and wherein the BJT further has a rectifying junction contact in place of a collector region and accompanying ohmic contact; and
wherein the at least one EOS/ESD protection circuit has a first I-V characterization curve having a first snapback voltage, wherein at least one of the functional devices has a second I-V characterization curve having a second snapback voltage, and wherein the rectifying junction contact in the at least one EOS/ESD protection circuit causes the first snapback voltage to be less than the second snapback voltage.