Granted Patent
Utility
US 4,017,188 · App. 05/553,332
Surface profile measuring device and method
Inventor:
Takeo Sawatari
Patented Case
View Patent ↗
Granted: Apr 12, 1977
Filed: Feb 26, 1975
Inventor
Takeo Sawatari
Assignee (at issue)
Bendix Limited
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.