IP Library Granted Patent US 4,183,460
Granted Patent Utility
US 4,183,460 · App. 05/863,696

In-situ test and diagnostic circuitry and method for CML chips

Inventors: Raymond C. Yuen, Mark Anthony Pius MENEZES, Herbert Stopper
Patented Case View Patent ↗
Granted: Jan 15, 1980 Filed: Dec 23, 1977
Inventors
Raymond C. Yuen
Mark Anthony Pius MENEZES
Herbert Stopper
Assignee (at issue)
Burroughs, Inc.

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Quick Facts
Patent No.
US 4,183,460
App. No.
05/863,696
Filed
1977-12-23
Granted
1980-01-15
Kind
A