Granted Patent
Utility
US 4,281,449 · App. 06/106,339
Method for qualifying biased burn-in integrated circuits on a wafer level
Inventors:
Kenneth A. Ports, Thomas R. St. Clair
Patented Case
View Patent ↗
Granted: Aug 4, 1981
Filed: Dec 21, 1979
Inventors
Kenneth A. Ports
Thomas R. St. Clair
Assignee (at issue)
HARRIS CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.